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Simplified MLE method for parameters in Weibull distribution comprehensive constant-stress accelerated life tests

A comprehensive stress and accelerated life test technology, applied in complex mathematical operations, electrical digital data processing, design optimization/simulation, etc., can solve problems such as long test period, difficulty in parameter estimation and analysis, and unsuitable high test stress level

Active Publication Date: 2018-11-13
SOUTHWEST JIAOTONG UNIV
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Problems solved by technology

[0004] However, in single-stress ALT, in order to keep the failure mechanism of the product unchanged during the test, the test stress level should not be too high, which will inevitably lead to a longer test period; on the other hand, using the traditional MLE method to analyze the When ALT data is statistically analyzed, parameter estimation is often difficult to analyze and cumbersome to calculate, and numerical calculation methods are usually required

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  • Simplified MLE method for parameters in Weibull distribution comprehensive constant-stress accelerated life tests
  • Simplified MLE method for parameters in Weibull distribution comprehensive constant-stress accelerated life tests
  • Simplified MLE method for parameters in Weibull distribution comprehensive constant-stress accelerated life tests

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Embodiment

[0120] This example is to simulate the failure process of Y11X series aerospace electrical connectors, using ambient temperature and vibration as the accelerated stress of the accelerated life test, and using the generalized Eyring model as the accelerated model. The research on the accelerated test of Y11X series aerospace electrical connectors shows that under the combined action of ambient temperature and vibration stress, the change point of the failure mechanism of Y11X series aerospace electrical connectors is (158°C, 1.0g 2 / Hz), which is the highest stress level combination point of Y11X series aerospace electrical connectors. On the other hand, according to the national standard GJB101A-1997, the normal stress level combination of Y11X series aerospace electrical connectors can be selected as (85°C, 0.06g 2 / Hz).

[0121] Through the statistical analysis of a large number of preliminary test data, as well as the research on the accelerated test and reliability of the...

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Abstract

The invention belongs to the technical field of accelerated life tests (ALT) and particularly relates to a simplified MLE method for parameters in Weibull distribution comprehensive constant-stress accelerated life tests. The simplified MLE method for Weibull distribution comprehensive constant-stress accelerated life test data is given against the problems that the test cycle of a single-stress ALT is long and it is difficult to solve maximum likelihood estimation of Weibull distribution parameters, and the feasibility and effectiveness of the given simplified MLE method for the Weibull distribution comprehensive constant-stress accelerated life test data and reliability assessment are verified by performing statistical analysis on Monte Carlo simulation failure time of the comprehensiveconstant-stress accelerated life tests of an aerospace electric connector.

Description

technical field [0001] The invention belongs to the technical field of accelerated life test, and in particular relates to a simplified MLE method for parameters in a Weibull distribution comprehensive stress constant addition test. Background technique [0002] Accelerated life test (ALT) is a life test method that accelerates product failure by increasing the test stress while keeping the failure mechanism unchanged; its purpose is to use the accelerated model to extrapolate the test under the accelerated stress Statistical inference is made on various reliability indicators of products under normal stress levels. ALT can shorten the test cycle, improve test efficiency, and reduce test cost. The introduction of ALT technology provides a new way to solve the life and reliability evaluation of high reliability and long life products. ALT is divided into constant stress ALT (abbreviated as constant addition test, CSALT), step stress ALT (abbreviated as step addition test, SS...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06F17/50G06F17/17
CPCG06F17/17G06F30/20
Inventor 梁红琴冯雪峰韩雷
Owner SOUTHWEST JIAOTONG UNIV
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