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High and low temperature thermal deformation integrative test system

A technology of comprehensive testing and high and low temperature testing, which is applied in the field of high and low temperature thermal deformation comprehensive testing systems, and can solve the problems of lack of high and low temperature simulation system test methods

Inactive Publication Date: 2018-11-16
SHANGHAI SATELLITE ENG INST
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  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, there is currently a lack of high and low temperature simulation systems and related test methods that meet the needs

Method used

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  • High and low temperature thermal deformation integrative test system
  • High and low temperature thermal deformation integrative test system

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Embodiment Construction

[0019] The implementation of the present invention will be described in detail below, and the implementation of specific steps is carried out on the premise of the technical solution of the present invention, and the detailed implementation and specific operation process are given here.

[0020] Such as figure 1 As shown, a high and low temperature thermal deformation comprehensive testing system according to an embodiment of the present invention includes:

[0021] The high and low temperature test room is used to provide the high and low temperature environment required for structural product testing through automatic adjustment system equipment operation;

[0022] High rigidity, high thermal stability ground support equipment, used to provide rigid support for structural products and thermal deformation measurement benchmarks in high and low temperature environments;

[0023] Optical measuring equipment is used to conduct thermal deformation tests on structural products in...

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Abstract

The invention provides a high and low temperature thermal deformation integrative test system. The high and low temperature thermal deformation integrative test system comprises a high and low temperature test room used for providing the high and low temperature environment needed for testing structural products by automatically adjusting system equipment running, high-rigidity and high thermal stability ground supporting equipment used for providing rigid support for the structural products and thermal deformation measuring under the high and low temperature environment, and optical measuringequipment used for conducting a thermal deformation test to the structural products in a test room through a high-accurate test window, and guaranteeing accuracy requirements of the thermal deformation test. The high and low temperature thermal deformation integrative test system mainly meets the requirements of high and low temperature environment simulation and the high-accurate test during theprocess of thermal deformation test of satellite structural products, and the advantages of high testing accuracy, high applicability and the like are achieved.

Description

technical field [0001] The invention relates to the field of satellite structure testing, in particular to a high and low temperature thermal deformation comprehensive testing system. Background technique [0002] Structural thermal deformation is one of the important factors affecting the positioning accuracy and attitude stability of remote sensing satellites. The adaptive support structure of the satellite payload needs to meet the high thermal stability requirements of on-orbit deformation. In the ground development stage, it is necessary to design, predict and control the on-orbit deformation of the satellite structure. On the basis of accurate thermal deformation simulation, conduct structural thermal deformation tests to predict and control the on-orbit deformation of the satellite structure to ensure high precision of the satellite structure. Realization of thermal deformation control index. [0003] The thermal deformation test of satellite structure needs to simul...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): B64G7/00B64G1/10
CPCB64G1/10B64G7/00
Inventor 庞亚飞赵发刚申军锋吴静怡蔡爱峰
Owner SHANGHAI SATELLITE ENG INST
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