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Dot matrix sandwich structure bending test device

A sandwich structure, bending test technology, applied in the measurement device, using a stable bending force to test the strength of materials, instruments, etc., can solve the problem of low stiffness measurement accuracy, achieve high-precision measurement, reduce measurement costs, and improve measurement. The effect of precision

Active Publication Date: 2018-11-20
BEIJING UNIV OF TECH
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0004] In order to improve the current situation that the measurement accuracy of the bending stiffness of the existing lattice sandwich structure laminates is too low, the present invention provides a lattice sandwich structure bending experimental device

Method used

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  • Dot matrix sandwich structure bending test device
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Experimental program
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Embodiment Construction

[0014] The present invention will be further described below in conjunction with the accompanying drawings and specific embodiments.

[0015] First of all, it is necessary to measure the experimental specimen. The method is to measure the width and thickness of any three places within the span of the experimental specimen, and take the arithmetic mean value. The thickness of the panel shall be the nominal thickness or the average thickness of the same batch of samples. Record the number of unit cells in the cross section.

[0016] Then install the experimental specimens. Since the specimens are sandwich structures, some experimental specimens have no side walls, so the central axis screws cannot be clamped. For sandwich structures without side walls, gypsum can be filled in the clamping position for clamping. The texture of gypsum is soft and has little effect on the experimental results.

[0017] During the loading process, the experimental specimen will be deformed to a ce...

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PUM

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Abstract

The invention discloses a dot matrix sandwich structure bending test device. The test device is mainly composed of a bottom supporting portion, a centering clamping portion and a measuring portion. The test device can effectively improve the measurement precision, reduce the measurement cost, and realize high-precision measurement on the bending test deflection of a dot matrix sandwich structure.The device can well solve the problem of a supporting seat clearance during loading, and track the mid-surface of the dot matrix sandwich structure to obtain a high-precision deflection value so as toimprove the calculation precision of bending rigidity of a laminated board.

Description

technical field [0001] The invention is a novel test device for testing the bending mechanical properties of a lattice sandwich structure, which can effectively improve the measurement accuracy, reduce the measurement cost, and realize high-precision measurement of the deflection in the bending test of the lattice sandwich structure. Background technique [0002] Since the lattice sandwich structure was proposed, its light weight, high specific stiffness and high specific strength have attracted great attention. In addition, it also has special properties such as shock absorption, heat dissipation, sound absorption, and electromagnetic shielding. It is a new type of structural functional material that comprehensively considers factors such as material design, structural design, and functional design. The study found that the equivalent stiffness and equivalent strength of the lattice sandwich structure have an approximately linear relationship with the equivalent density of ...

Claims

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Application Information

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IPC IPC(8): G01N3/20G01N3/02G01N3/04
CPCG01N3/02G01N3/04G01N3/20G01N2203/0023G01N2203/04
Inventor 龙连春张嘉王林刚梁言
Owner BEIJING UNIV OF TECH