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Testing device and method of control system

A control system and test device technology, applied in the field of measurement and control, can solve problems such as filament damage, resource consumption, and inability to meet the test requirements of the control system

Active Publication Date: 2018-11-30
NAT INST OF METROLOGY CHINA
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] In the prior art, the control system is tested through the filament, and the construction of the test environment consumes resources, and it is easy to cause damage to the filament, which cannot meet the higher testing requirements of the control system.

Method used

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  • Testing device and method of control system

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Embodiment Construction

[0047] In order to better understand the technical solutions of the present invention, the embodiments of the present invention will be described in detail below with reference to the accompanying drawings.

[0048] It should be clear that the described embodiments are only a part of the embodiments of the present invention, rather than all the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those of ordinary skill in the art without creative work shall fall within the protection scope of the present invention.

[0049] The terms used in the embodiments of the present invention are only for the purpose of describing specific embodiments, and are not intended to limit the present invention. The singular forms of "a", "said" and "the" used in the embodiments of the present invention and the appended claims are also intended to include plural forms, unless the context clearly indicates other meanings.

[0050] Depending on the context, ...

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Abstract

The invention provides a testing device and method of a control system, and relates to the technical field of measurement and control. The testing device of the control system can test the stability of the control system. The testing device comprises a first resistor, a second resistor, a controllable voltage source, a signal acquisition module and a processor. The two ends of the first resistor are separately connected to an input interface and an output interface of the control system; the first end of the second resistor is connected to the input interface of the control system, and the second end of the second resistor is connected to the controllable voltage source; the controllable voltage source is connected to the processor; the signal acquisition module is used for acquiring the voltage difference of the two ends of the first resistor; and the processor is used for determining the size of the current of the first resistor according to the voltage difference of the two ends ofthe first resistor to judge whether the control system is in normal condition or not. The technical scheme of the testing device and method of the control system is suitable for the stability testingprocess of an electronic ionization control system.

Description

【Technical Field】 [0001] The present invention relates to the technical field of measurement and control, in particular to a test device and method of a control system. 【Background technique】 [0002] The electron ionization source of the mass spectrometer includes the control system and the filament, such as figure 1 As shown, in the working state, the power supply unit in the control system (including the power supply module, transformer, and rectifier module) applies a driving voltage to the filament in a vacuum environment to heat the filament according to the comparison result of the comparator. At a certain temperature, the free electron e in the filament material - Escape, floating at negative voltage V f Under the effect of e - Accelerate the movement to the electron receiving end to form the emission current. [0003] At present, in order to ensure the normal operation of the electronic ionization source, it is usually necessary to test the control system based on the fila...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G05B23/02
CPCG05B23/0208
Inventor 刘梅英江游方向王宁黄泽建龚晓云
Owner NAT INST OF METROLOGY CHINA