13 results about "Electron ionization" patented technology

The invention provides a control circuit and a control method of an electron ionization source and a quadrupole mass spectrometer. The control circuit comprises a first filament heating circuit, a second filament heating circuit, a detection circuit and a logic circuit. The logic circuit is electrically connected with the detection circuit, the first filament heating circuit and the second filament heating circuit, and controls the first filament heating circuit and the second filament heating circuit according to the detected current. According to the invention, the filament is directly protected in the control circuit according to the size of the ion current, so that the response delay is minimized. And multiple-level improvement of the sensitivity of the ion source can be realized. In a conventional mode, a user can select the double filaments to work alternately, and the maintenance frequency of the ion source is not affected.

The invention relates to the technical field of mass spectrum analyzers, in particular to a mass spectrum ionization device and method for cooperatively monitoring dirt and carbon. The device comprises a high-pressure photochemical ionization cavity and a low-pressure photoelectron ionization cavity, an ion transmission module and an ion convergence reaction electrode group are arranged in the high-pressure photochemical ionization cavity; organic product ions are generated in the high-pressure photochemical ionization cavity and penetrate through a differential electrode to be transmitted into the low-pressure photoelectron ionization cavity; an electron transmission module, an ion convergence multi-pole rod group and an ion extraction electrode are arranged in the low-pressure photoelectron ionization cavity, the low-pressure photoelectron ionization cavity generates inorganic product ions, and the inorganic product ions and organic product ions penetrate through the ion extraction electrode and are transmitted to the mass analyzer for detection. Cascade connection of the two ion sources under different working air pressures is realized through vacuum difference, so that ionization detection of the two ionization sources can be obtained through single sample introduction, the analysis coverage of a mass spectrometer is greatly improved, and the application field is widened.

The application relates to the field of laser technology and discloses a high-harmonic wave and above-threshold ionization synergic regulation method and system, which adopts a fundamental frequency light and multiple auxiliary fields to form a time-space overlapping composite laser field, adjusts the wavelength, intensity, delay time and polarization direction of the auxiliary field, forms a multi-parameter laser field, takes the multi-parameter laser field as a physical action carrier, synchronously collects HHG spectral intensity distribution and ATI electron spectrum data by using a high-sensitivity spectrometer and an electron spectrometer on the basis of the multi-parameter laser field, inputs the data into a Bayesian optimization algorithm, dynamically adjusts laser parameters, obtains an optimal laser parameter combination, adjusts an electron re-collision probability by adjusting laser ellipticity based on the obtained optimal laser parameter combination, controls an electron ionization time and return energy by using a two-color field carrier envelope phase, synchronously optimizes an HHG cutoff frequency and an ATI spectrum peak position, and realizes closed-loop control; and the application realizes synergic regulation of high-harmonic wave generation and above-threshold ionization processes.

An electron ionization source including at least one gas source assembly having at least one nozzle having at least one outlet configured to deliver at least one analyte material into at least one ionization region, at least one electron source assembly configured to generate at least one electron beam intersecting the ionization region, and at least one fixture configured to positionally secure the gas source assembly such that the outlet of the nozzle is aligned relative to the electron beam, the fixture comprises a first jaw defining a clamping space to receive a clamping section of the gas source assembly, a second jaw movably coupled to the first jaw and configured to clamp the clamping section within the clamping space, wherein one or more fasteners may be operated to adjust the vertical position of the gas source assembly along at least one of the x-axis, y-axis, and / or z-axis within the clamping space, wherein the gas source assembly may be alignable in three dimensions relative to the electron beam and to an inlet of a vacuum pump positioned downstream of the ionization region.

The invention belongs to the technical field of mass spectrum analyzers, and particularly relates to a radial sample injection magnetic enhancement photoelectron ionization source device, one side of an ionization source cavity is provided with a sample injection interface, the opposite side is provided with a hole electrode, and the ionization source cavity is internally provided with a magnetic enhancement photoelectron ionization area and an ion funnel transmission area; the repulsion electrode is located between one side of the focusing electrode and the sample introduction interface, and an ion funnel transmission area is arranged between the other side of the focusing electrode and the hole electrode; a focusing electrode is arranged on the ionization source cavity, a vacuum ultraviolet light source is arranged on the ionization source cavity corresponding to the focusing electrode, a magnet A and a magnet B are respectively arranged above and below the focusing electrode, the magnet A is positioned between the vacuum ultraviolet light source and the focusing electrode, a photoelectric cathode is arranged on the magnet B, and light of the vacuum ultraviolet light source is irradiated on the photoelectric cathode after passing through the magnet A and the focusing electrode. According to the invention, the detectable object range of the photoionization source is widened, and the sensitivity of an analyte is remarkably improved.

An ion source 21 of a quadrupole mass analyzing apparatus 100 includes: a filament 211 that emits electrons when a voltage is applied to the filament 211; an ionization box 212 that ionizes a sample when electrons enter the ionization box 212; and a blocking member 214 that is placed between the filament 211 and the ionization box 212, and blocks a film-forming material from moving toward the ionization box 212, the film-forming material being to form a film in the ionization box 212.

This invention discloses an active hydrogen radical generator for targeted reduction of nickel ions in electronic wastewater, relating to the field of wastewater treatment technology. It includes a main body with a rear inspection cover, a dielectric barrier discharge unit, a gas-liquid mass transfer unit, a wastewater supply unit, and an electrical control cabinet located within the main body. A sandwich-type DBD structure is formed by an inner layer of mesh ceramic, an outer layer of mesh ceramic, and a porous polyimide film. The pore sizes of these three layers are uniform and correspond one-to-one, enabling the formation of stable and uniform low-temperature plasma within micron-level micropores. This eliminates the generation of large electric arcs, significantly increasing the generation and distribution uniformity of active hydrogen radicals, achieving targeted and efficient reduction of nickel ions. Simultaneously, relying on the micro-hollow cathode effect, it enhances electron ionization efficiency, further improving the reduction reaction rate and the purity of elemental nickel.

Provided are a method and system for degrading SF6 based on the placement of copper rings (201) on inner electrodes of DBD. The method comprises: delivering precisely proportioned and diluted SF6 into a DBD reactor (200), electrode rods in the DBD reactor (200) discharging to form an electric field, and a plurality of copper rings (201) on the electrode rods being used to alter local discharge gaps and the electric field to achieve degradation of SF6; introducing the diluted SF6 into a plasma environment, SF6 molecules being bombarded by high-energy electrons and ionized and excited molecules to undergo a cleavage reaction to generate low-toxicity or non-toxic decomposition products. The resulting decomposition products are easier to adsorb and treat compared to SF6, reducing the amount of diluent gas required, lowering cost waste, and effectively improving the degradation efficiency of SF6.

The application relates to the technical field of mass spectrometry, in particular to a laser-induced cold electron neutral post-ionization source. When an ion beam or laser sputters a sample surface, neutral plume is generated. Based on the principle of photoelectric effect, a high-brightness photoelectron is generated by irradiating the cathode surface with a light source. The photoelectron obtains sufficient energy under the acceleration of an electric field, can ionize the neutral gas phase plume, and achieves the purpose of improving sensitivity and eliminating ionization matrix effect. By adjusting the extraction electric field, the distribution of electrons and the extraction efficiency of ions can be optimized, and better ionization efficiency and ion utilization rate can be obtained. Compared with hot electrons, photoelectrons can work under different gas pressures and have the characteristics of cold electron ionization.

This product provides a flavor enhancer that amplifies the top notes, which have a significant impact on the palatability of food and beverages. [Solution] The flavor enhancer according to the present invention contains an extract of roasted coffee beans. The extract contains an extraction solvent containing alcohols. The extract, in a total ion chromatogram obtained by electron ionization at 70 eV using a gas chromatograph-mass spectrometer equipped with a quadrupole mass spectrometer and a polar column, contains peaks of compounds in group A, compounds in group B, and compounds in group C, and the value obtained by dividing the sum of the peak area % of compounds in group A by the sum of the peak area % of compounds in group B and the peak area % of compounds in group C is 1.0 or more (wherein the peak area % represents the ratio of the peak area of ​​each compound to the sum of the peak areas of all compounds excluding the solvent contained in the roasted coffee bean extract).

The utility model relates to a small-sized electron ionization source hot cathode structure, which comprises insulating glass provided with a plurality of through holes; the connecting column penetrates through the through hole of the insulating glass; the metal fixing plate is arranged at the joint of the insulating glass and the connecting column; the metal fixing plate and the insulating glass are sintered to form a glass-gold sealing area, and the glass-gold sealing area is used for fixing the connecting column; the lamp filaments are welded to the fixing columns, and the number of the lamp filaments is two; a filament grating is fixedly arranged in the middle of the insulating glass; the two ends of the lamp filament grating are provided with the folded edges, so that electrons are more uniformly released in the middle of the lamp filament and are distributed to the lamp filament grating area. According to the utility model, the connecting column is fixed by sealing the sealing area through the glass gold, so that the stability and durability of the whole structure are enhanced; the lamp filaments are arranged into two groups, and the two lamp filaments are lightened at the same time in a vacuum environment so as to release electrons to the maximum extent.

The invention discloses a twisted wire corona initial voltage prediction method based on a finite element method, and the method comprises the steps: selecting a parallel smooth wire with the same outer radius as a target twisted wire as a reference structure, calculating the corona initial field intensity of the reference structure through employing a Pickup formula, and calculating the electric field distribution of the reference structure based on the corona initial field intensity, a dynamic criterion constant suitable for the target twisted wire is obtained through classical corona initial criterion back calculation in combination with the integral relation between the electron ionization coefficient and the electron adhesion coefficient; establishing a finite element model based on the actual structure parameters of the target twisted wire, and calculating the electric field distribution of the surface of the twisted wire and the adjacent area of the model under the applied voltage through a finite element method; and combining the dynamic criterion constant with the electric field distribution of the target twisted wire, and solving a voltage value meeting a corona initial condition and a corona initial voltage corresponding to the target twisted wire through iterative calculation.