Miniaturized phase frequency tester

A tester and intermediate frequency technology, applied in the field of miniaturized phase-frequency tester, can solve the problems of slow test efficiency, expensive test equipment, and complex test system, so as to improve test efficiency and overcome low test efficiency

Active Publication Date: 2018-12-18
CHINA ACADEMY OF SPACE TECHNOLOGY
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  • Abstract
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  • Application Information

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Problems solved by technology

[0003] There are two main phase-frequency test methods currently used: one is to use "signal source + spectrum analyzer + Oscilloscope + computer" test method, the test system is complex, takes up more equipment, and the test efficiency is slower; the second is to use the vector network analyzer "delay" mode for testing, the test speed is fast, but the test equipment is expensive

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Embodiment Construction

[0034] In order to make the object, technical solution and advantages of the present invention clearer, the embodiments disclosed in the present invention will be further described in detail below in conjunction with the accompanying drawings.

[0035] refer to figure 1 , shows a structural block diagram of a miniaturized phase-frequency tester in an embodiment of the present invention. In this embodiment, the miniaturized phase-frequency tester includes: a digital sampling module 101, which is used to synchronously sample the modulated signal generated by the signal source and the intermediate frequency signal after passing through the transponder channel to obtain two differential digital signals. signal; wherein, the two differential digital signals include: a modulated sampling signal and an intermediate frequency sampling signal. The data processing module 102 is configured to perform phase estimation on the two differential digital signals to obtain phase estimation val...

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Abstract

The invention discloses a miniaturized phase frequency tester. The miniaturized phase frequency tester comprises a digital sampling module and a data processing module; the digital sampling module isused for synchronously sampling a modulation signal generated by a signal source and an intermediate frequency signal passing through a transponder channel to obtain two differential digital signals,wherein the two differential digital signals comprise a modulation sampling signal and an intermediate frequency sampling signal; and the data processing module is used for conducting phase estimationon the two differential digital signals to obtain phase estimation values and conducting phase comparison on the phase estimation values to obtain phase frequency testing data. According to the miniaturized phase frequency tester, phase frequency testing is completed by means of an embedded software platform through a digital phase comparison mode, signal acquisition equipment and signal processing equipment in the prior art are integrated into one, miniaturization of testing equipment is achieved, and the testing efficiency is improved.

Description

technical field [0001] The invention belongs to the technical field of testing, in particular to a miniaturized phase-frequency tester. Background technique [0002] With the development of applications and technological progress, the requirements for data transmission capacity are increasing. Due to differences in device manufacturing tolerances, temperature and environmental characteristics, the phases of signals in large-capacity communication systems will be different, thereby affecting system performance. Therefore, In the process of communication satellite payload test, there are more and more requirements for the test of system phase frequency performance. [0003] There are two main phase-frequency test methods currently used: one is to use "signal source + spectrum analyzer + Oscilloscope + computer" test method, the test system is complex, takes up more equipment, and the test efficiency is slower; the second is to use the vector network analyzer "delay" mode for ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R23/02G01R25/00
CPCG01R23/02G01R25/00
Inventor 韩笑刘茹马强张阁
Owner CHINA ACADEMY OF SPACE TECHNOLOGY
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