A sliced ​​battery reference slice and calibration method thereof

Abstract

The invention discloses a method for calibrating a reference sheet of a sliced ​​battery, which belongs to the field of photovoltaics, and includes: obtaining the short-circuit current of the entire battery sheet and the short-circuit current of the sliced ​​battery sheet through QE testing, and using a battery sheet detection machine to test the entire battery sheet Carry out the test, adjust the light intensity of the cell detection machine so that the measured short-circuit current is the same as the short-circuit current of the entire cell, and use the light intensity of the cell detection machine at this time as the standard light intensity for testing the entire cell ; Connect the sliced ​​cell and the dummy to obtain a false whole cell; the shape of the fake whole cell is the same as that of the whole cell; the cell detection machine detects the sliced ​​cell under standard light intensity, and obtains the open circuit voltage Uoc and filling of the sliced ​​cell Factor FF. The reference slices calibrated by this calibration method can solve the problem that sliced ​​cells cannot be tested and graded according to efficiency due to the absence of sliced ​​cell reference sheets to calibrate the cell inspection machine after slicing. The invention also provides a sliced ​​battery reference sheet.

Description

technical field [0001] The invention relates to the field of photovoltaic technology, in particular to a sliced ​​cell reference sheet and a calibration method thereof. Background technique [0002] With the continuous development and progress of photovoltaic industry technology, the power of crystalline silicon modules has been increasing rapidly, and high-power crystalline silicon solar modules such as half-cell and laminated sheets have gradually become the mainstream direction of photovoltaic industry development. [0003] The design and packaging of sliced ​​battery components can better reduce power loss and increase output power. At the same time, due to the optimized circuit design, the anti-hot spot ability of the components is enhanced. The uneven distribution of internal defects in the crystalline silicon material and the differences in the cell process lead to incomplete spectral responses in each area of ​​the cell, which in turn makes the obtained sliced ​​cell...

AI Technical Summary

Problems solved by technology

[0004] Aiming at the problems existing in the prior art, the present invention provides a calibration method for sliced ​​battery reference slices, which solves the problem that there is no sliced ​​battery reference slice at present

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