A slice battery reference piece and a calibration method thereof

Abstract

The invention discloses a calibration method of a slice battery reference piece, belongs to the photovoltaic field, and includes obtaining short-circuit current of a whole battery piece and short-circuit current of a slice battery piece through a QE test, a battery chip detecting machine is used to test the whole battery piece, and the light intensity of the battery piece detecting machine is adjusted so the the short-circuit current measured is the same as the short-circuit current of the whole battery piece, and the light intensity of the battery piece detecting machine is used as the standard light intensity of the whole battery piece. Connecting the sliced battery piece and the dummy piece to obtain a dummy whole piece; The pseudo-whole piece has the same shape as the whole piece; Theopen-circuit voltage Uoc and fill factor FF of the sliced cell slice were obtained by detecting the sliced cell slice with the battery slice detecting machine under the standard light intensity. The reference slice calibrated by the calibration method can solve the problem that the slice battery slice cannot be tested and be classified according to the efficiency because no slice battery referenceslice is provided for calibration of the battery slice detection machine after slicing. A slice battery reference piece is also provided.

Description

technical field [0001] The invention relates to the field of photovoltaic technology, in particular to a sliced ​​cell reference sheet and a calibration method thereof. Background technique [0002] With the continuous development and progress of photovoltaic industry technology, the power of crystalline silicon modules has been increasing rapidly, and high-power crystalline silicon solar modules such as half-cell and laminated sheets have gradually become the mainstream direction of photovoltaic industry development. [0003] The design and packaging of sliced ​​battery components can better reduce power loss and increase output power. At the same time, due to the optimized circuit design, the anti-hot spot ability of the components is enhanced. The uneven distribution of internal defects in the crystalline silicon material and the differences in the cell process lead to incomplete spectral responses in each area of ​​the cell, which in turn makes the obtained sliced ​​cell...

AI Technical Summary

Problems solved by technology

[0004] Aiming at the problems existing in the prior art, the present invention provides a calibration method for sliced ​​battery reference slices, which solves the problem that there is no sliced ​​battery reference slice at present

Images