Electromagnetic field composite probe and detection system

Abstract

The application relates to an electromagnetic field composite probe and a detection system. The electromagnetic field composite probe comprises a first SMA connector, a second SMA connector and a PCBboard, wherein the PCB board comprises a signal transmission portion and an electromagnetic field probe; the electromagnetic field probe is electrically connected to one end of the first SMA connectorand one end of the second SMA connector through the signal transmission portion, and the other end of the SMA connector and the other end of the second SMA connector are used to connect an analysis device; the electromagnetic field probe detects the electromagnetic field of the circuit board to be tested to obtain a radio frequency signal, and transmits the radio frequency signal to the analysisdevice to analyse and obtain an electric field parameter and a magnetic field parameter by sequentially pass through the signal transmission portion and the first SMA connector, and the signal transmission portion and the second SMA connector. According to the electromagnetic field composite probe and the detection system, the measurement of the electric field and the magnetic field at the same point can be realized, and the detection efficiency is high, the problem of detecting the mutual interference of the double physical quantity caused by adopting different detection structures can be avoided, and the accuracy is high.

Description

technical field [0001] The present application relates to the technical field of electromagnetic detection, in particular to an electromagnetic field composite probe and detection system. Background technique [0002] With the development of science and technology, the structure of electronic equipment is more miniaturized, high-frequency and high-density, which can reduce the occupied space of electronic equipment, but it will also cause EMC (Electro Magnetic Compatibility) problems, resulting in low electromagnetic reliability of electronic equipment . Interference image reconstruction based on near-field scanning is the most effective method to deal with EMC design problems, and the key tool of near-field scanning is the probe. [0003] Near-field scanning includes detection of electric fields and detection of magnetic fields. Most of the traditionally used probes detect the electric field and magnetic field separately. The position point of detecting the electric field...

AI Technical Summary

Problems solved by technology

Most of the traditionally used probes detect the electric field and magnetic field separately. The position point of detecting the electric field is different from the position point of detecting the magnetic field. It is difficult to realize the simultaneous measurement and analysis of the electric field and magnetic field at the same point, and the detection efficiency is low.

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