Electromagnetic field composite probe and detection system

An electromagnetic field and probe technology, which is applied in the field of electromagnetic field composite probes and detection systems, can solve problems such as low detection efficiency and difficulty in achieving simultaneous measurement and analysis of electric and magnetic fields at the same point

Active Publication Date: 2018-12-21
CHINA ELECTRONICS PROD RELIABILITY & ENVIRONMENTAL TESTING RES INST
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  • Abstract
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  • Claims
  • Application Information

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Problems solved by technology

Most of the traditionally used probes detect the electric field and magnetic field separately. The position point of detecting the electric field is different from the position point of d...

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  • Electromagnetic field composite probe and detection system
  • Electromagnetic field composite probe and detection system

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Embodiment Construction

[0015] In order to make the purpose, technical solution and advantages of the present application clearer, the present application will be further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described here are only used to explain the present application, and are not intended to limit the present application.

[0016] In one embodiment, refer to figure 1 , provides an electromagnetic field compound probe, which can be used for electromagnetic field detection of a circuit board to be tested (including an integrated circuit on the board). The electromagnetic field composite probe includes a first SMA (Sub-Miniature-A referred to as SMA) connector 110, a second SMA connector 120 and a PCB board (not shown), the PCB board includes a signal transmission part 130 and an electromagnetic field probe 140; the electromagnetic field probe 140 One end of the first SMA connector 110 and one ...

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Abstract

The application relates to an electromagnetic field composite probe and a detection system. The electromagnetic field composite probe comprises a first SMA connector, a second SMA connector and a PCBboard, wherein the PCB board comprises a signal transmission portion and an electromagnetic field probe; the electromagnetic field probe is electrically connected to one end of the first SMA connectorand one end of the second SMA connector through the signal transmission portion, and the other end of the SMA connector and the other end of the second SMA connector are used to connect an analysis device; the electromagnetic field probe detects the electromagnetic field of the circuit board to be tested to obtain a radio frequency signal, and transmits the radio frequency signal to the analysisdevice to analyse and obtain an electric field parameter and a magnetic field parameter by sequentially pass through the signal transmission portion and the first SMA connector, and the signal transmission portion and the second SMA connector. According to the electromagnetic field composite probe and the detection system, the measurement of the electric field and the magnetic field at the same point can be realized, and the detection efficiency is high, the problem of detecting the mutual interference of the double physical quantity caused by adopting different detection structures can be avoided, and the accuracy is high.

Description

technical field [0001] The present application relates to the technical field of electromagnetic detection, in particular to an electromagnetic field composite probe and detection system. Background technique [0002] With the development of science and technology, the structure of electronic equipment is more miniaturized, high-frequency and high-density, which can reduce the occupied space of electronic equipment, but it will also cause EMC (Electro Magnetic Compatibility) problems, resulting in low electromagnetic reliability of electronic equipment . Interference image reconstruction based on near-field scanning is the most effective method to deal with EMC design problems, and the key tool of near-field scanning is the probe. [0003] Near-field scanning includes detection of electric fields and detection of magnetic fields. Most of the traditionally used probes detect the electric field and magnetic field separately. The position point of detecting the electric field...

Claims

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Application Information

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IPC IPC(8): G01R29/08
CPCG01R29/0878
Inventor 邵伟恒方文啸李广伟恩云飞黄云郭远东贺致远王磊邵鄂
Owner CHINA ELECTRONICS PROD RELIABILITY & ENVIRONMENTAL TESTING RES INST
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