A detection device and detection method for laminated substrates

Abstract

The invention provides a detection device and method for a substrate laminated material. The detection device comprises a light source device, a light collection device and a processing device in coupled connection with the light collection device, wherein an included angle between incident light emitted by the light source device and a plane where the to-be-detected substrate laminated material is located is theta 1, and the theta 1 is greater than 0 and less than 180 degrees; the light collection device collects reflected light of the to-be-detected substrate laminated material for the incident light to form a detection image; and the processing device processes the detection image and analyzes whether parameters of the detection image are matched with preset parameters or not. Accordingto the detection device and method, the included angle between the incident light and the plane where the to-be-detected substrate laminated material is located can be adjusted, so that the detectioneffect can be improved.

Description

technical field [0001] The present application belongs to the detection field, and in particular relates to a detection device and a detection method for laminated substrates. [0002] technical background [0003] When making a liquid crystal display panel, it is necessary to cut the color filter substrate and / or the TFT substrate constituting the display panel. At present, a single glass cutting machine (Single Glass Cutting, referred to as: SUT) is mostly used to complete the cutting process. figure 1 It is a schematic diagram of cutting the substrate. Use a veneer cutting machine to cut the laminated color filter substrate and TFT substrate to remove the color filter substrate and / or TFT substrate with a width of about 12.5mm, and cut out the position along the cutting line 12 for Connecting to the curing pad 11 of the alignment ultraviolet liquid crystal irradiation machine, the phenomenon that the residual material often adheres to the color filter substrate or the TFT ...

AI Technical Summary

Problems solved by technology

The regular reflected light 23 enters the microscope to form a white image, and the diffuse reflected light 25 is difficult to enter the microscope to form a black image. The cutting line is black and the same as the background color. Only the edge line 36 of the substrate exists in the microscope, and the cutting quality of the entire area of ​​the cutting surface cannot be detected. , and the distance from the cutting line to the edge of the substrate cannot be detected

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