A processor debugging method for extracting fault field feature test excitation

Abstract

The invention discloses a processor debugging method for extracting error field characteristic test excitation. The method comprises executing the original test excitation and records the original execution data stream in the running environment; according to the information of the designated suspected error instruction, searching the original execution data stream to obtain the hot instruction and obtaining the hot instruction list; the hot instruction list being analyzed one by one to retrieve the register information that the instruction depends on; searching data corresponding to all dependency information of all hot-spot instructions in the original execution data stream; converting hot instructions and corresponding dependency data into test code and compiling to generate executablefeature test excitation; running feature test incentives in the test environment, recording the running status of running feature test incentives or using debugging methods for debugging. The invention reduces the time for finding error points and reproducing errors in the debugging process by automatically extracting characteristic test incentives from the original incentives through a given flowand information, thereby reducing the time and energy spent in the whole debugging process.

Description

technical field [0001] The invention relates to debugging technology in verification test in microprocessor design, in particular to a processor debugging method for extracting error field feature test excitation. Background technique [0002] Testing is an essential process in microprocessors, and as much testing as possible must be done to ensure the correctness of the processor design. The earlier the defect is found, the lower the cost of repairing the defect, and the higher the value of the test. The lower the number of defects found through the complete test, the higher the design quality. To solve the found defects, the designer must analyze the test incentives, and it is even more necessary to re-site the error when debugging. [0003] As the project advances, the design will become more and more mature, and a large number of various tests will be performed during integration testing. The stimuli used in these tests are mainly some directional functional test stimu...

AI Technical Summary

Problems solved by technology

The process of analyzing the cause of the error is related to the specific design, and the specific time cannot be determined. For example, the error result of an instruction execution can determine which part of the design is wrong, and this process takes a very short time; other complex problems require waveform analysis and multiple debugging. to identify design issues

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