Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

A classification method of light-variable curves based on support vector machine

A technology of support vector machine and light curve, which is applied in the direction of computer parts, instruments, characters and pattern recognition, etc., can solve the problems of less feature quantity, data fluctuation influence, lack of recognition ability, etc., and achieve accurate classification and strong resistance The effect of interference ability

Active Publication Date: 2018-12-28
淮北市生产力促进中心
View PDF5 Cites 3 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Kepler uses a polynomial to fit the light curve, and gives the light curve type according to the width and depth of the main minimum and sub-minimum of the fitted curve; both ASAS and ROTES use Fourier transform to extract the frequency characteristics of the light curve data , classify according to the proportional relationship between DC, 2nd order and 4th order frequency components in the obtained frequency values. Due to the use of less feature quantities, it is easy to be affected by data fluctuations caused by instrument test errors and weather reasons. For abnormal astronomical phenomena Abnormal light curve lacks recognition ability

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • A classification method of light-variable curves based on support vector machine
  • A classification method of light-variable curves based on support vector machine
  • A classification method of light-variable curves based on support vector machine

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0037] The technical solution of the present invention will be described in detail below in conjunction with the accompanying drawings.

[0038] Such as figure 1 As shown, a light curve classification method based on a support vector machine in an embodiment of the present invention includes the following steps:

[0039] Step 10) Collect light curve data and light curve type. Wherein, the light curve data is the brightness change data of the star with time. The light curve type is determined according to the shape of the light curve's primary minimum, secondary minimum, and light curve peaks, and there are usually EA, EB, and EW types. Different light curve types correspond to different positional relationships of the binary stars. Among them, EA corresponds to the separated binary star, EB corresponds to the semi-separated binary star, and EW corresponds to the contacting binary star.

[0040] Step 20) Perform preprocessing on the light curve data collected in step 10), s...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses a light change curve classification method based on a support vector machine, which comprises the following steps: Step 10) collecting light change curve data and light changecurve types; Step 20) preprocessing the collected light change curve data; Step 30) constructing a data set to be analyzed according to the preprocessed light change curve data, and dividing the dataset into a training set and a test set; Step 40) setting kernel function and punishment coefficient of the support vector machine, training initial classification model by using the constructed training set to obtain the trained classification model, testing the correct rate of the trained classification model by using the constructed test set, and taking the trained classification model whose correct rate reaches the set threshold value as the final classification model; Step 50) classifying the light curve by using the final classification model. The method has strong anti-interference ability to the noise signal, more accurate classification, and can detect the abnormal light curve type at the same time.

Description

technical field [0001] The invention relates to the field of astronomical data observation and analysis, in particular to a method for classifying light curves based on a support vector machine. Background technique [0002] For a long time, astronomical research approaches mainly include spectroscopy and imaging in the optical band. The traditional research methods are manual selection of several targets, tracking and shooting, data processing and analysis. This research method is inefficient, and the astronomical community has been in a state of data scarcity for a long time. Driven by emerging technologies such as information and computing technology, the field of astronomical research has shifted from the traditional mode of observation with fewer targets and manual data processing to a data-intensive era. A large number of sky survey projects have provided a large amount of data for astronomical research, such as ROTSE, ASAS, SuperWAS, MACHO, OGLE, SDSS, LAMOST, and K...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
IPC IPC(8): G06K9/62
CPCG06F18/214G06F18/2411
Inventor 袁慧宇杨远贵赵娟戴海峰
Owner 淮北市生产力促进中心
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products