A DC testing method and apparatus for AEP memory

A test method and memory test technology, which are applied in the fault hardware test method, the use of remote testing to detect faulty hardware, and the detection of faulty computer hardware, etc., can solve the problems of wasting time and manpower, and achieve simple structure, reliable design principle, The effect of saving time and manpower

Inactive Publication Date: 2019-01-18
ZHENGZHOU YUNHAI INFORMATION TECH CO LTD
View PDF7 Cites 1 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

At present, most of them require manual rep

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • A DC testing method and apparatus for AEP memory
  • A DC testing method and apparatus for AEP memory
  • A DC testing method and apparatus for AEP memory

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0068]In order to enable those skilled in the art to better understand the technical solutions in the present invention, the technical solutions in the embodiments of the present invention will be clearly and completely described below in conjunction with the drawings in the embodiments of the present invention. Obviously, the described The embodiments are only some of the embodiments of the present invention, not all of them. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts shall fall within the protection scope of the present invention. In order to enable those skilled in the art to better understand the technical solutions in the present invention, the technical solutions in the embodiments of the present invention will be clearly and completely described below in conjunction with the drawings in the embodiments of the present invention. Obviously, the described The embo...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

A DC testing method and apparatus for AEP memory are provided in that embodiment of the present application, the method including: setting initial parameters of the AEP memory; starting the testing machine with AEP memory by using the controller; Scanning test parameters of the AEP memory; Obtaining a performance state of the AEP memory according to the initial parameter and the test parameter; stopping a testing machine by using a script. The invention can automatically carry out DC test on the AEP memory, does not need manual operation, improves the test efficiency and accuracy, and saves alot of time and manpower at the same time.

Description

technical field [0001] The invention belongs to the technical field of AEP memory performance testing, and in particular relates to an AEP memory DC testing method and device. Background technique [0002] AEP memory, referred to as Apache Pass DIMMs, is an indispensable device for private clouds, servers, and accelerated computing. The main positioning is to replace DRAM (Dynamic Random Access Memory, server memory) and support persistent Memory or In-Memory applications. The operation of the server requires high reliability. When the server contains AEP memory, it needs to conduct a series of reliability tests to ensure that there will be no abnormalities in the hands of future users. [0003] DC test is a test in which the remote control test machine is turned on multiple times to test the stability of hardware or software. At present, most of them require manual repeated operations, which wastes time and manpower. Contents of the invention [0004] Aiming at the def...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
IPC IPC(8): G06F11/22
CPCG06F11/2273G06F11/2294
Inventor 贠雄斌
Owner ZHENGZHOU YUNHAI INFORMATION TECH CO LTD
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap