Test circuit of infrared receiver

A technology of infrared receiving head and test circuit, which is applied in the direction of electrical connection test, etc., can solve the problems of low test efficiency, long time consumption, large error of manual reading value, etc., and achieve simple structure, convenient use, and improved automation Effect

Active Publication Date: 2021-12-10
SHENZHEN SKYWORTH DIGITAL TECH CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0006] This method of testing mainly relies on people. Not only is the test efficiency low, but the error in manual reading is large, but it also takes a long time when the number of samples increases or multiple tests are required to take the average.

Method used

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  • Test circuit of infrared receiver
  • Test circuit of infrared receiver
  • Test circuit of infrared receiver

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0039] figure 1 Embodiment 1 of the present invention provides a block diagram of a test circuit of an infrared receiving head. The test circuit of the infrared receiving head in this embodiment is used to perform a compatibility test on the infrared receiving head during material replacement. The test circuit of the infrared receiving head in this embodiment includes an infrared emitting module 11 , an infrared receiving module 12 and a control module 13 .

[0040] The infrared emission module 11 is used for sending multiple infrared emission signals with different intensities in time division. In this embodiment, the infrared emitting module 11 includes at least one or more infrared emitters for emitting or external light. The operating current of the infrared emitter can be adjusted through a preset time interval, such as 10 seconds or 20 seconds, so that the infrared emitter sends out infrared emission signals of different intensities to simulate infrared rays with differ...

Embodiment 2

[0046] figure 2 A block diagram of a test circuit of an infrared receiving head provided in Embodiment 2 of the present invention. The test circuit of the infrared receiving head of this embodiment provides different resistances for controlling the intensity of the infrared transmission signal, so as to realize the detection of the infrared receiving head in the material Compatibility testing is performed during the replacement process. The test circuit of the infrared receiving head in this embodiment includes an infrared emitting module 11 , an infrared receiving module 12 and a control module 13 .

[0047] The infrared emitting module 11 includes a resistor module 111 and an infrared emitter 112 , the resistor module 111 is used to provide a variety of resistors with different resistance values, and one end of the resistor module 111 is connected to the infrared emitter 112 . In this embodiment, the resistor module 111 is a plurality of resistors with different resistance...

Embodiment 3

[0054] Figure 5 A block diagram of a test circuit of an infrared receiving head provided by Embodiment 3 of the present invention. The test circuit of the infrared receiving head in this embodiment provides a display device for displaying the compatibility test of the infrared receiving head during the material replacement process. result. The test circuit of the infrared receiving head in this embodiment includes an infrared emitting module 11 , an infrared receiving module 12 , a control module 13 and a display device 14 .

[0055] The infrared receiving module 12 includes a detection circuit board 121, and the detection circuit board 121 is used for detachably connecting at least one infrared receiving head to be tested. In this embodiment, the infrared receiving heads to be tested are three IR1-IR3.

[0056] The infrared emitting module 11 includes a resistance module 111 , an infrared emitter 112 and a switch module 113 .

[0057] In this embodiment, the resistance mod...

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PUM

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Abstract

The embodiment of the present invention discloses a test circuit of an infrared receiving head, comprising: an infrared emitting module, used for sending a plurality of infrared emitting signals of different intensities in time; an infrared receiving module, used for connecting the infrared receiving head to be tested, the The infrared receiving head to be tested receives the multiple infrared transmission signals of different intensities to generate different pulse signals; the control module is used to control the operation of the infrared transmission module and receive the pulse signals, and the control module detects the width of the pulse signals and display. The testing circuit of the infrared receiving head of the invention is simple and convenient.

Description

technical field [0001] The embodiment of the present invention relates to the field of electronic product detection, in particular to a test circuit of an infrared receiving head. Background technique [0002] As an input device of an electronic product, an infrared receiving head is widely used in various electronic products, such as a remote control of a home appliance. Although a new generation of short-distance communication and control technology, such as Bluetooth technology, has begun to be popularized in remote controls, due to the characteristics of simple, fast response and low cost, the corresponding codec function module of infrared remote control still dominates household consumer products so far. Most of the market share of remote controls. [0003] In the life cycle of electronic products, it is impossible to use any kind of components except the main control chip from a single supplier. Considering the cost, quality or supply capacity, etc., new electronic c...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01R31/66
CPCG01R31/66
Inventor 李伟张万里
Owner SHENZHEN SKYWORTH DIGITAL TECH CO LTD
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