Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

QTL for resistance to wheat powdery mildew in adult stage and molecular marker thereof

A technology of wheat powdery mildew and molecular markers, which is applied in the field of wheat genetics and breeding, can solve the problems of slow selection speed and the like, and achieve the effect of improving breeding efficiency

Active Publication Date: 2019-02-01
SHANDONG AGRICULTURAL UNIVERSITY
View PDF3 Cites 1 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0006] Aiming at the gaps in the prior art, the present invention provides a wheat powdery mildew adult plant resistance QTL QPm594_1D and its closely linked molecular markers, which have important utilization value in breeding. The molecular markers can be used to quickly, efficiently and efficiently Quantitatively detect and determine whether the germplasm to be tested has wheat powdery mildew adult plant resistance, efficiently screen wheat germplasm resources with wheat powdery mildew adult plant resistance QTL, and apply it to the aggregation of genes with good traits or wheat powdery mildew Molecular marker-assisted selection breeding for resistance at the adult plant stage solves the practical problems of slow selection, low detection efficiency, and low detection throughput common to previous breeding, and improves the efficiency of wheat powdery mildew resistance breeding at the adult plant stage

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • QTL for resistance to wheat powdery mildew in adult stage and molecular marker thereof
  • QTL for resistance to wheat powdery mildew in adult stage and molecular marker thereof
  • QTL for resistance to wheat powdery mildew in adult stage and molecular marker thereof

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0024] Example 1 Location of QTL and determination of molecular markers

[0025] NO.1 Experimental materials and methods

[0026] NO.1.1 Experimental materials

[0027] The test material TutoumaiA is a landrace wheat variety that is highly susceptible to various wheat powdery mildew physiological races at the seedling stage and high resistance at the adult plant stage; SY936 is a commonly used cultivar that is highly resistant to powdery mildew at both the seedling stage and the adult plant stage. High sense. In this study, the RIL (recombinant inbred line) population constructed using TutoumaiA and SY936 as parents contained 154 lines.

[0028] NO.1.2 Phenotype identification

[0029] NO.1.2.1 Field test

[0030] The parent and RIL population materials were planted in the agronomy experimental field of the South School of Shandong Agricultural University in 2015, 2016, and 2017 respectively. The on-demand method was adopted, with a plant spacing of 7 cm and a row width ...

Embodiment 2

[0065] Example 2 Detection by Molecular Markers

[0066] NO.1 Genomic DNA extraction of wheat to be tested (CTAB method):

[0067] The specific steps of DNA extraction by CTAB method: (a) Take about 100 mg of young wheat leaves in a 96-well deep-well plate, use a freeze-vacuum dryer to drain the water in the leaf tissue, and then place it in a tissue grinder to grind the leaves into powder; (b) Add 600-800 μL CTAB solution to a 96-well deep-well plate equipped with crushed leaves, then cover the deep-well plate and place it in a water bath at 65°C for 90-120 minutes, during which time shake lightly 3-4 times to fully lyse the DNA; ( c) After the water bath is completed, add 600-800 μL (volume equal to that of CTAB) chloroform isoamyl alcohol (volume ratio 24:1) and shake gently for 10 minutes; (d) Centrifuge at 4000 rad / min for 10 minutes and take about 600 μL of supernatant Place in a new 96-well deep-well plate (note the corresponding serial number); (e) add isopropanol e...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention belongs to the field of wheat genetic breeding and provides a QTL for resistance to wheat powdery mildew in an adult stage. The QTL is named as QPm594_1D (positioning result is shown inFig. 1), is located in the short arm of a 1D chromosome of common wheat, and exhibits resistance to wheat powdery mildew in an adult stage. QTL can explain at least 15% of phenotypic variation. QPm594_1D is tightly linked to a high-throughput molecular marker named as KASP-QPm594_1D. The molecule is labeled as a single nucleotide polymorphism site. The SNP site has G / A mutation. The molecular marker can be detected through a group of primers comprising 2 forward primers and 1 reverse primer. The positive allelic variation of the QTL locus is from the parental variety TutoumaiA. The QTL molecular marking has great application values in assisted breeding, wheat excellent trait gene polymerization and wheat disease resistance germplasm detection.

Description

technical field [0001] The invention belongs to the field of wheat genetics and breeding, and in particular relates to a wheat powdery mildew adult plant stage resistance QTL and a molecular marker thereof. Background technique [0002] Wheat (Triticum aestivum L.) is one of the three most important food crops in the world, and its sowing area and output both rank first in the world. In my country, the planting area of ​​wheat is second only to rice, and is the second largest food crop. In 2018, the planting area was about 360 million mu, with a total output of 127 million tons, accounting for about 20% of the food crop output. Therefore, wheat production is of great significance to the improvement of people's living standards. [0003] Powdery mildew is one of the important factors that limit the high yield of wheat. When the damage is light, it can lead to a 5%-10% reduction in the yield of the above-ground part of wheat, and when it is severe, it can reach more than 20%....

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): C12Q1/6895
CPCC12Q1/6895C12Q2600/13
Inventor 刘树兵李文辉殷慧娟刘春霞
Owner SHANDONG AGRICULTURAL UNIVERSITY
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com