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Defect detection method, device, computer equipment and storage medium

A defect detection and defect technology, applied in the computer field, can solve the problems of poor detection effect, large amount of calculation, low efficiency, etc., and achieve the effect of speeding up the detection processing time, improving efficiency and accurate detection.

Active Publication Date: 2021-02-05
SHENZHEN ZVIT TECH CO LTD
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

Although there are many traditional defect detection methods, either the detection effect is not good, or the calculation is large and the efficiency is low

Method used

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  • Defect detection method, device, computer equipment and storage medium
  • Defect detection method, device, computer equipment and storage medium
  • Defect detection method, device, computer equipment and storage medium

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Embodiment Construction

[0049] In order to make the object, technical solution and advantages of the present invention clearer, the present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described here are only used to explain the present invention, not to limit the present invention.

[0050] Such as figure 1 As shown, a defect detection method is proposed, which can be applied not only to a terminal but also to a server. This embodiment uses the terminal as an example for illustration. The defect detection method specifically includes the following steps:

[0051] Step 102, acquiring a target image corresponding to the target subject to be detected.

[0052] Wherein, the target subject refers to a target object to be detected for defects, and the target image refers to an image of the target subject. The target image can be a color image, a gray image, or a binarized image. ...

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Abstract

The present application relates to a defect detection method, which includes: acquiring a target image corresponding to a target subject to be detected, performing Gaussian difference processing on the target image to obtain a Gaussian difference image, and determining the target subject according to the Gaussian difference image When there are multiple defects in the target image, the position of each defect in the target image is obtained, the coincidence degree between two defects is calculated according to the position of each defect, the defects are merged according to the coincidence degree, and the The merged target defect information corresponding to the subject. In addition, a defect detection device, computer equipment and storage medium are also proposed.

Description

technical field [0001] The present invention relates to the field of computer technology, in particular to a defect detection method, device, computer equipment and storage medium. Background technique [0002] In industrial production, it is necessary to perform defect detection on the produced products. For example, after the textile industry produces cloth, it is necessary to detect whether there are defects or defects in the cloth, so as to facilitate timely repair and improve the quality of the cloth. Although there are many traditional defect detection methods, either the detection effect is not good, or the calculation is large and the efficiency is low. Therefore, there is an urgent need to propose a defect detection method with high efficiency and good effect. Contents of the invention [0003] Based on this, it is necessary to provide a high-efficiency and effective defect detection method, device, computer equipment and storage medium for the above-mentioned pr...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G06T7/00G06T7/62G06T7/70G06T5/00
CPCG06T7/0004G06T7/62G06T7/70G06T5/70
Inventor 周凯廖方诚张孟吴小飞曾江东王珂王文涛江银凤
Owner SHENZHEN ZVIT TECH CO LTD