A contactless smart card reading terminal and a working method thereof
A technology of a card reading terminal and a working method, applied in the field of non-contact smart card reading terminals, can solve the problems of reduced card reading performance, uncontrollable, and the inability to reach the maximum card reading test field strength of the non-contact smart card reading terminal. Improve the card reading performance, reduce the defect rate, and avoid the effect of reducing the card reading performance
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment 1
[0025] Embodiment 1 of the present invention provides a working method of a contactless smart card reader terminal, such as figure 1 As shown, it includes the following steps: Step 101: The card reader terminal performs field strength testing by configuring the combination of capacitor banks, and records all the test field strengths and all test field strengths obtained by configuring the combination of capacitor banks for field strength testing. Corresponding configuration value; select the maximum test field strength from all test field strengths;
[0026] Step 102: The card reader terminal saves the configuration value corresponding to the maximum test field strength or configures the combination of capacitor banks corresponding to the maximum test field strength.
[0027] Optionally, in step 101, configure the combination of capacitor groups, specifically: the card reader terminal controls the connection and disconnection of the combination of capacitor groups according to...
Embodiment 2
[0072] Embodiment 2 of the present invention provides a working method of a non-contact smart card reader terminal, wherein the capacitance values of the capacitor banks in the method increase sequentially, and the method includes the following steps:
[0073] Step 201: The card reader terminal configures the capacitor bank combination according to the capacitance value of the capacitor bank, and conducts the field strength test in sequence according to the configuration sequence of the capacitor bank combinations until the maximum test field strength is found. When the capacitor bank combination is the first in the configuration sequence When one, the maximum test field strength is greater than or equal to the test field strength of the latter test field strength, perform step 202; when the combination of capacitor banks is not the first and last in the configuration sequence, the maximum test field strength is greater than Or equal to the test field strength of the previous...
Embodiment 3
[0107] Embodiment 3 of the present invention provides a working method of a non-contact smart card reader terminal, such as figure 2 As mentioned above, a plurality of capacitor groups are added to the non-contact smart card reader terminal, and the size of the total capacitance in the card reader terminal circuit is changed through the capacitor group, so that the card-reading performance of the non-contact smart card card reader terminal can be optimized gradually; When the optimal test field strength is detected and the test is completed, the configuration value is used to record the measured capacitor group corresponding to the optimal test field strength, and the card reader terminal uses the measured capacitor group corresponding to the optimal test field strength According to the corresponding configuration value, according to the control of the connection and disconnection of the combination of the capacitor group corresponding to the configuration value corresponding ...
PUM
Login to View More Abstract
Description
Claims
Application Information
Login to View More 


