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Qualcomm scheme wireless calibration test system and Qualcomm scheme wireless calibration test method based on decompiled development

A test method and test system technology, applied in the directions of decompilation/disassembly, transmitter monitoring, program code conversion, etc., can solve the problems of complex redundancy in the test process, high retest rate, and low test efficiency, so as to reduce the test cost. The effect of retest rate, enhanced scalability, and improved test efficiency

Inactive Publication Date: 2019-02-15
TAICANG T&W ELECTRONICS CO LTD
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Problems solved by technology

[0003] The purpose of the present invention is to provide a wireless calibration test system and method based on decompilation and development of Qualcomm solutions, which solves the problem of complex and redundant testing process when testing Qualcomm Qdart solutions in existing testing methods, low test efficiency and high retest rate. high problem

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  • Qualcomm scheme wireless calibration test system and Qualcomm scheme wireless calibration test method based on decompiled development

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[0033] In order to make the object, technical solution and advantages of the present invention clearer, the present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described here are only used to explain the present invention, not to limit the present invention.

[0034] figure 1 It shows an embodiment of a wireless calibration test system of Qualcomm solution developed based on decompilation in the present invention: a wireless calibration test system of Qualcomm solution developed based on decompilation, including automatic production test platform ATE_Release, decompiled Reflector analysis Environmental test computer; including IQxel or WT208 instrument; including power divider; after the test computer, the IQxel or WT208 instrument, and the power divider are connected in sequence, the power divider is connected to the DUT respectively.

[0035] Accordin...

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Abstract

The invention discloses a Qualcomm scheme wireless calibration test system and a Qualcomm scheme wireless calibration test method based on decompiled development. The system comprises a test computerinstalled with an automated production test platform ATE_Release and a decompiled Reflector analysis environment, an IQxel or WT208 instrument, and a power splitter, wherein the test computer, the IQxel or WT208 instrument, and the power splitter are sequentially connected by the power splitter, and then connected to the DUT by the power splitter. Based on an IQxel or WT208 instrument and a computer (built-in test platform), the Qualcomm scheme wireless calibration test system and method based on decompiled development provided by the invention develop a self-research Qualcomm calibration testprogram based on Qualcomm's latest QSPR API library and combined decompiled analysis tools, so that the power calibration and test of many wireless terminal products can be realized, thereby reducingprogram redundancy, enhancing program scalability and editability, greatly improving the test efficiency, and reducing the test retest rate.

Description

technical field [0001] The invention relates to the field of production and manufacturing of communication electronic products, in particular to a wireless calibration test system and method based on decompilation and development of a high-pass solution. Background technique [0002] The calibration test program of Qualcomm Qdart solution in the industry has always relied on the production test program provided by the equipment manufacturer for factory production. The problems brought about by this are poor maintainability and poor scalability, and the test procedures provided by equipment manufacturers are very redundant, the test efficiency is not high, and the retest rate is also high. Therefore, it is very necessary to develop self-developed and efficient calibration test procedures. Contents of the invention [0003] The purpose of the present invention is to provide a wireless calibration test system and method based on decompilation and development of Qualcomm solu...

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): H04B17/11H04B17/21G06F8/53
CPCH04B17/11G06F8/53H04B17/21
Inventor 王海
Owner TAICANG T&W ELECTRONICS CO LTD
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