Unlock instant, AI-driven research and patent intelligence for your innovation.

Data analysis method, device, electronic device, and computer-readable storage medium

A technology of data analysis and electronic equipment, applied in the field of data processing, can solve the problems of statistical analysis result deviation, inaccurate results, data distribution deviation, etc., and achieve the effect of reducing labor costs and data analysis time

Active Publication Date: 2021-10-15
HEFEI JADARD TECHNOLOGY CO LTD
View PDF4 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] The above-mentioned processing method needs to group the data first and then analyze it. Since the performance of the data after grouping is no longer the performance of the original data, the method of analysis after grouping will lead to deviations in the distribution of data, which will indirectly lead to the results of statistical analysis. will also be biased, which will lead to inaccurate results

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Data analysis method, device, electronic device, and computer-readable storage medium
  • Data analysis method, device, electronic device, and computer-readable storage medium
  • Data analysis method, device, electronic device, and computer-readable storage medium

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0041] In order to make the object, technical solution and advantages of the present invention clearer, the present invention will be described in detail below in conjunction with the accompanying drawings and specific embodiments.

[0042] Such as figure 1 Shown is a flowchart of a preferred embodiment of the data analysis method of the present invention. According to different requirements, the order of the steps in the flowchart can be changed, and some steps can be omitted.

[0043] The data analysis method is applied to one or more electronic devices, and the electronic device is a device that can automatically perform numerical calculation and / or information processing according to preset or stored instructions, and its hardware includes but is not limited to Microprocessor, application specific integrated circuit (Application Specific Integrated Circuit, ASIC), programmable gate array (Field-Programmable Gate Array, FPGA), digital processor (Digital Signal Processor, D...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention provides a data analysis method, device, electronic equipment and computer-readable storage medium. The method includes: testing a plurality of test points on the wafer, obtaining a set of wafer acceptance test WAT factor values ​​for each test point, and a set of WAT factor values ​​for each test point corresponding to the wafer composed of At least one IC yield rate of the integrated circuit IC; according to at least one IC yield rate of the integrated circuit IC formed by the wafer corresponding to a group of WAT factor values ​​of each test point, the IC yield corresponding to each test point is calculated. rate; according to a group of WAT factor values ​​of each test point in the plurality of test points, and the IC yield rate corresponding to each test point, determine the data model representing the mapping relationship between the WAT factor and the IC yield rate; obtain the described The coefficient corresponding to each WAT factor in the data model; according to the coefficient corresponding to each WAT factor, determine the WAT factor that affects the IC yield corresponding to the wafer.

Description

technical field [0001] The present invention relates to the technical field of data processing, in particular to a data analysis method, device, electronic equipment and computer-readable storage medium. Background technique [0002] In the existing technical scheme, when performing data processing on the acceptance results of the wafer online quality inspection, firstly, the wafers should be grouped according to the IC (integrated circuit, integrated circuit) yield rate, and then the WAT (Wafer acceptance test, wafer acceptance Test) factors and the grouping results of IC yield rate are statistically analyzed to find the factors that may cause the IC yield rate to decline. [0003] The above-mentioned processing method needs to group the data first and then analyze it. Since the performance of the data after the grouping is no longer the performance of the original data, the method of analysis after the grouping will lead to deviations in the distribution of the data, which...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): G06F17/18H01L21/66
CPCG06F17/18H01L22/10
Inventor 陈冠廷马厚文朱畅
Owner HEFEI JADARD TECHNOLOGY CO LTD