Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Checking device

An inspection device, a circular technology, applied to measuring devices, instruments, and electromagnetic wave detection, etc., can solve the problems of low inspection accuracy and inability to obtain inspection areas at the same time, and achieve the effect of high-precision inspection and high-speed inspection

Inactive Publication Date: 2019-03-15
SUMITOMO CHEM CO LTD
View PDF2 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0015] That is, the present inventors have found that in the inspection performed by rotating the above-mentioned object, a sharp image cannot be obtained simultaneously on the entire inspection area, and therefore, the problem that the accuracy of the inspection is lowered occurs.

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Checking device
  • Checking device
  • Checking device

Examples

Experimental program
Comparison scheme
Effect test

Embodiment approach 1

[0054] image 3 It is a figure which shows the structure of the electromagnetic wave receiving part 31a (n electromagnetic wave receiving regions) which concerns on Embodiment 1 of this invention, and shows the planar state of the circular outer surface 2b. The electromagnetic wave receiving unit 31 a has three electromagnetic wave receiving regions 321 to 323 .

[0055] The electromagnetic wave receiving area 321 has m small areas composed of a small area 3211 , a small area 3212 , . . . , a small area 321(m−1), and a small area 321m. And, small area 3211, small area 3212, ..., small area 321 (m-1) and small area 321m are observed in plan view of circular outer surface 2b, and the diameter 331 of the circle constituting the outer shape of circular outer surface 2b They are arranged side by side sequentially from the center 3 sides toward the edge side of the circle.

[0056] The electromagnetic wave receiving area 322 has m small areas composed of a small area 3221 , a smal...

Embodiment approach 2

[0062] Figure 4 It is a figure which shows the structure of the electromagnetic wave receiving part 31b (n electromagnetic wave receiving regions) which concerns on Embodiment 2 of this invention, and shows the planar state of the circular outer surface 2b.

[0063] The electromagnetic wave receiving unit 31b has the same configuration as the electromagnetic wave receiving unit 31a except for the points described below. In addition, the following "circumferential direction" means the direction along the circumference of the circle which comprises the outer shape of the circular outer surface 2b (and the circular outer surface 2a).

[0064] In the electromagnetic wave receiving area 321, the size in the circumferential direction of the small area 3212 is larger than the size in the circumferential direction of the small area 3211, ..., the size in the circumferential direction of the small area 321m is larger than the size in the circumferential direction of the small area 321...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The present invention provides a checking device which can check a target object highly accurately and quickly. The checking device has electromagnetic wave reception regions. Each of the electromagnetic wave reception regions includes m pieces of smaller regions which are arranged along a diameter of a circle in a plan view of a circular profile surface.

Description

technical field [0001] The present invention relates to inspection devices. Background technique [0002] Nonaqueous electrolyte secondary batteries such as lithium ion secondary batteries are widely used as batteries for personal computers, mobile phones, portable information terminals, and the like. In particular, lithium-ion secondary batteries can reduce CO as compared to conventional secondary batteries. 2 Attention is paid to batteries that contribute to energy saving due to their low discharge volume. [0003] Conventionally, the development of a separator wound body in which a separator for a non-aqueous electrolyte secondary battery is wound around a core has progressed. Furthermore, an inspection for detecting foreign matter adhering to the separator wound body was studied. [0004] As an example of an inspection for detecting foreign matter adhering to an object, the technique disclosed in Patent Document 1 is cited. In the technique disclosed in Patent Docume...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G01V3/12
CPCG01V3/12G01N23/04G01N2223/401G01N2223/652G01N23/046G06T3/4038
Inventor 加集功士屋铺大三郎
Owner SUMITOMO CHEM CO LTD
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com