Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Method for calculating accidental E-layer short wave field strength of mid-latitude region

A calculation method and short-wave technology, applied in the direction of electromagnetic field characteristics, measuring devices, instruments, etc., can solve the problems of not being able to adapt to the requirements of Es communication calculations, and the prediction accuracy of E-layer field strength is difficult to meet actual needs.

Active Publication Date: 2019-03-19
中国电波传播研究所
View PDF10 Cites 5 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

The disadvantage is: for the communication link, the calculation method of the signal field strength in the middle and low end of the HF band is not included; in practical applications, the foE observation value is different from the foE value definition of a given occurrence rate, and cannot Simply using the foE observation value to replace the foE value of a given occurrence rate, the current research on the change law of the ionospheric radio environment is far from meeting the requirements of Es communication calculations, and the prediction accuracy of the occasional E-layer field strength is difficult to meet the actual needs

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Method for calculating accidental E-layer short wave field strength of mid-latitude region
  • Method for calculating accidental E-layer short wave field strength of mid-latitude region
  • Method for calculating accidental E-layer short wave field strength of mid-latitude region

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0102] Example 1, such as figure 1 As shown, this embodiment discloses a calculation method for the occasional E-layer short-wave field strength in the mid-latitude region, using the foE value of vertical incidence on the middle point of the path and the great-circle distance of the short-wave link, and considering the ionospheric absorption fading, according to the short-wave The transmission characteristics of the link determine the position of the reflection point, calculate the ionospheric foE and foEs values ​​at the reflection point, and further calculate the occasional E-layer short-wave field strength value.

[0103] Specifically include:

[0104] S101: Calculate the great-circle distance of the short-wave link, the position of the reflection point and its electronic cyclotron frequency according to the position information of the transmitting and receiving points, and calculate the elevation angle of radio wave radiation by using the Smith method. This step specific...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses a method for calculating accidental E-layer short wave field strength of a mid-latitude region. The method includes the following steps that A, according to position information of a receiving and transmitting point, a great circle distance and a reflecting point position of a short wave link and the electronic cyclotron frequency of the short wave link are calculated, anda radio wave radiation elevation is calculated based on the equivalent theorem; B, depending on a radio wave environment observation station of the science and technology industry of national defense,an ionized layer vertical sounding diagram and an ionized layer inclined sounding diagram of the reflecting point position are obtained; C, if there are no ionized layers foE and foEs which can be directly observed at the reflecting point position, firstly, an MUFEs value of inclined sounding is converted into an foEs value at a middle point of an inclined sounding link; D, according to short wave communication features, occurrence conditions of strong Es are determined, the ionized layer absorption loss of the reflecting point position is calculated, and accordingly the accidental E-layer field strength is worked out. According to method for calculating the accidental E-layer short wave field strength of the mid-latitude region, ionized layer vertical sounding and inclined sounding datacan be comprehensively utilized, and the foEs value of the reflecting point position is worked out.

Description

technical field [0001] The invention belongs to the field of ionospheric environment monitoring research, in particular to a method for calculating the occasional E-layer short-wave field strength in the mid-latitude region in the field. Background technique [0002] The sporadic E layer (Es layer) is the sudden inhomogeneous structure of the E layer, which is named for its indeterminate appearance time. Usually, the Es layer exists in the daytime in the equatorial region, and there is not much seasonal variation; the value of foEs in the mid-latitude region is relatively low, and there is obvious seasonal variation. It is especially worth noting that the southeastern region of my country is a high-occurrence area of ​​the Es layer. In the summer of the year with a low sunspot number, Es often appears, and the value of foEs is very high. The radio signal reflected by the Es layer is usually strong, but if the reflective layer is translucent, it may cause trouble for communi...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
IPC IPC(8): G01R29/08
CPCG01R29/0814
Inventor 陈春班盼盼王保健盛冬生王飞飞
Owner 中国电波传播研究所
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products