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Server high and low temperature reliability test method and device

A test method and server technology, applied in fault hardware test methods, detection of faulty computer hardware, etc., can solve problems such as incomplete information, testers cannot make comprehensive judgments, etc., and achieve wide application prospects, reliable design principles, simple structure

Inactive Publication Date: 2019-03-19
ZHENGZHOU YUNHAI INFORMATION TECH CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0003] Since these reliability temperature tests often require manual observation of data and records, and manual switching of test stress scripts, testers are often required to observe and record test results and operate machines in real time; when problems arise in the test, it is often necessary to manually query the previous log files, However, the information recorded in the log file is not comprehensive, and the testers cannot make a comprehensive judgment, and can only make judgments based on experience

Method used

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  • Server high and low temperature reliability test method and device
  • Server high and low temperature reliability test method and device
  • Server high and low temperature reliability test method and device

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Embodiment Construction

[0058]In order to enable those skilled in the art to better understand the technical solutions in the present invention, the technical solutions in the embodiments of the present invention will be clearly and completely described below in conjunction with the drawings in the embodiments of the present invention. Obviously, the described The embodiments are only some of the embodiments of the present invention, not all of them. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts shall fall within the protection scope of the present invention.

[0059] Key terms appearing in this application are explained below.

[0060] figure 1 is a schematic flowchart of a method in an embodiment of the present application. in, figure 1 The executing subject may be a server high and low temperature reliability testing device.

[0061] Such as figure 1 As shown, the method 100 includes: ...

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Abstract

The invention provides a server high and low temperature reliability test method and device. The method comprises the following steps: setting test time, interval time and test times for circularly executing a test; setting a temperature threshold corresponding to the test temperature; Utilizing a thermocouple line to obtain the surface actual temperature of the chip of the key component of the system and storing the surface actual temperature of the chip into a log file; obtaining a Tj temperature of a key component of the system through the BMC and storing the Tj temperature into a log file;and comparing the actual temperature and the Tj temperature of the surface of the chip with corresponding temperature threshold values to obtain the high-low temperature reliability of the server. The chip surface temperature and the Tj temperature of the key component of the system are automatically read and recorded, the temperature threshold value is set, the system temperature is automatically monitored after comparison, the tested temperature is recorded, and maintenance personnel can conveniently check the tested temperature.

Description

technical field [0001] The invention belongs to the technical field of server testing, and in particular relates to a server high and low temperature reliability testing method and device. Background technique [0002] At present, the reliability temperature test of servers includes high and low temperature alternating damp heat test, high and low temperature power on and off, and alternating damp heat storage, etc., which has become the top priority of reliability testing. In the process of product testing, how to better analyze and record problems is an important research content in testing. [0003] Because these reliability temperature tests often require manual observation of data and records, and manual switching of test stress scripts, it is often necessary for testers to observe and record test results and operate machines in real time; when there is a problem with the test, it is often necessary to manually query the previous log files However, the information reco...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06F11/22
CPCG06F11/2273
Inventor 马壮高鹏
Owner ZHENGZHOU YUNHAI INFORMATION TECH CO LTD