S parameter detection apparatus and method

A technology for parameter detection and value monitoring, which is applied in the field of S parameter detection devices, can solve the problems of not being able to know the change of the transmission S21 parameter, not being able to monitor the change of the return loss of the input port, and not being able to monitor the phase change of the reflected signal, etc., to achieve The effect of expanding application functions, improving utilization, and improving efficiency

Active Publication Date: 2019-03-22
CHINA ELECTRONIS TECH INSTR CO LTD
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Problems solved by technology

[0008] (1) When micro-discharge occurs in the DUT, it is impossible to know the change of the standing wave at the port;
[0009] (2) When micro-discharge occurs in the tested part, it is impossible to know the change of tra

Method used

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  • S parameter detection apparatus and method
  • S parameter detection apparatus and method

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[0046] It should be noted that the following detailed description is exemplary and intended to provide further explanation of the present disclosure. Unless defined otherwise, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this disclosure belongs.

[0047] It should be noted that the terminology used herein is only for describing specific embodiments, and is not intended to limit the exemplary embodiments according to the present disclosure. As used herein, unless the context clearly dictates otherwise, the singular is intended to include the plural, and it should also be understood that when the terms "comprising" and / or "comprising" are used in this specification, they mean There are features, steps, operations, means, components and / or combinations thereof.

[0048] Explanation of terms:

[0049] VSWR: Voltage Standing Wave Ratio, voltage standing wave ratio.

[0050] In order to so...

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Abstract

The invention provides an S parameter detection apparatus and method. The S parameter detection apparatus is applied to a vacuum micro-discharge test apparatus and comprises a signal separation apparatus, a vector network analyzer and a main controller, wherein the signal separation apparatus is configured to separately divide a coupling transmission signal, a coupling reflection signal and a coupling output signal into two circuits of signals; the vector network analyzer is configured to receive a coupling transmission signal, a coupling reflection signal and a coupling output signal outputted by the signal separation apparatus and outputs a reflection signal amplitude variable quantity, a reflection signal phase variable quantity, a transmission amplitude variable quantity and a transmission phase variable quantity by virtue of corresponding measurement modes; and the main controller is configured to calculate echo loss, standing waves and transmission loss according to an input power monitoring value, a reflection power monitoring value and an output power monitoring value.

Description

technical field [0001] The disclosure belongs to the technical field of testing, and in particular relates to an S-parameter detection device and method. Background technique [0002] The statements in this section merely provide background information related to the present disclosure and do not necessarily constitute prior art. [0003] The micro-discharge effect, also known as the secondary electron multiplication effect, refers to the secondary electron emission and multiplication effect excited by free electrons between two metal surfaces or on the surface of a single medium under the acceleration of an external radio frequency field under vacuum conditions. This vacuum resonance discharge phenomenon is a very important factor affecting the reliability of space electronic equipment. [0004] The microdischarge effect mainly occurs in the radio frequency, microwave, and millimeter wave systems of the spacecraft. A spacecraft working normally in space orbit will be affe...

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Application Information

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IPC IPC(8): G01R31/00
CPCG01R31/00
Inventor 雷卫平郭荣斌
Owner CHINA ELECTRONIS TECH INSTR CO LTD
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