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SSD abnormal power failure test method and device, computer device and storage medium

A technology for electrical testing and testing machines, applied in static memory, instruments, etc., can solve the problems of wasting resources, wasting manpower, and one-to-one equipment, achieving the effects of wide coverage, sufficient testing, and improved efficiency

Active Publication Date: 2019-03-26
SHENZHEN YILIAN INFORMATION SYST CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0003] This method of controlling SSD power-down by manually controlling the power controller has the following disadvantages: first, the device is one-on-one, which wastes resources; second, it is inconvenient to test the device through a wired method; Control, uncertain, and limited coverage
This manual method of power-down testing for SSD is a waste of manpower, low efficiency and insufficient testing

Method used

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  • SSD abnormal power failure test method and device, computer device and storage medium
  • SSD abnormal power failure test method and device, computer device and storage medium
  • SSD abnormal power failure test method and device, computer device and storage medium

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Embodiment Construction

[0041] In order to make the purpose, technical solution and advantages of the present application clearer, the present application will be further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described here are only used to explain the present application, and are not intended to limit the present application.

[0042] Such as figure 2 As shown, the application environment diagram of the abnormal power-down test proposed in this patent. Specifically include: PC control machine, control transmitter, power receiving controller and SSD. Among them, the PC controller is directly connected to the control transmitter, and the control transmitter and the power control receiver interact wirelessly, using a one-to-many control method. The power control receiver is directly connected to the SSD.

[0043] In one embodiment, such as image 3 As shown, a SSD abnormal power-down test metho...

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Abstract

The invention relates to an SSD abnormal power-down test method and device, computer device and a storage medium. The method comprises the steps that an SSD abnormal power-down test request is acquired; Configuring a test setting parameter according to the SSD abnormal power-down test request, wherein the test setting parameter comprises an SSD test machine identifier needing power-down; Sending the test setting parameters to a control sender; And the control transmitter transmits a wireless signal to a power supply controller corresponding to the SSD test machine identifier needing power failure, so that the power supply controller controls the SSD test machine to perform an SSD abnormal power failure test according to the test setting parameters. According to the invention, a plurality of test devices are connected in a wireless manner by using one control transmitter, and abnormal power failure is carried out on the SSD through the configured parameters. Resources are saved, the efficiency is improved, the coverage of power failure time is wide, and the test is more sufficient.

Description

technical field [0001] The invention relates to the technical field of power-down testing, in particular to a method, device, computer equipment and storage medium for abnormal power-down testing of SSDs. Background technique [0002] At present, the test method for abnormal power-off of SSD mainly uses a manual way to power-off the SSD. Such as figure 1 As shown, the SSD is connected to the power controller, and the power controller is connected to the PC controller. The PC controller can control the power controller to power off the SSD abnormally. [0003] This method of manually controlling the power supply controller to control SSD power-off has the following disadvantages: first, the device is one-on-one, which wastes resources; second, it is inconvenient to test the device through a wired method; control, with uncertainty and limited coverage. This manual method of power-down testing for SSDs is a waste of manpower, low in efficiency and insufficient in testing. ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G11C29/08G11C29/56
CPCG11C29/08G11C29/56
Inventor 刘坚冯元元冷志源
Owner SHENZHEN YILIAN INFORMATION SYST CO LTD
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