In-situ X-ray CT imaging device for neutron diffraction spectrometer

Abstract

The invention discloses an in-situ X-ray CT imaging device for a neutron diffraction spectrometer. The in-situ X-ray CT imaging device comprises a fixed seat, a nanometer focus X-ray tube, an X-ray detector, a sealing container and a movable structure; the nanometer focus X-ray tube and the X-ray detector are arranged at two opposite sides of the fixed seat; the movable structure is arranged at the fixed seat in a sliding manner, the sealing container is arranged at the mobile structure, a sample is held in the sealing container, a neutron generator produces a neutron beam, and an included angle between an axis of the neutron beam and the axis of the nanometer focus X-ray tube is 45 DEG, the X-ray penetrates the sample and is detected by the X-ray detector, thereby performing real-time three-dimensional imaging on the sample. The simultaneous performing of the X-ray imaging and the neutron stress measurement can be satisfied, the mutual interference is avoided, expansion size and internal defects of the sample can be measured through the X-ray imaging technology, and the non-contact expansion factor measurement and the real-time internal defect measurement are realized.

Description

technical field [0001] The invention relates to the field of neutron diffraction, in particular to an in-situ X-ray CT imaging device for a neutron diffraction spectrometer. Background technique [0002] At present, with the development and progress of science and technology, in-situ tests of metal materials are gradually promoted. In-situ tests of metal materials usually need to be carried out at high or low temperatures, such as measuring expansion coefficient, internal stress, phase transition, etc. In order to establish the relationship between the properties of metal materials, internal residual stress, and microscopic defects, it is usually necessary to take multiple tests separately. When in-situ stress measurement and expansion coefficient determination are performed on the same sample, the identity of the measurement position cannot be guaranteed, and the expansion coefficient or internal microstructure of the sample will change due to heating twice. Therefore, it ...

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Problems solved by technology

[0004] In order to overcome the deficiencies in the prior art, one of the purposes of the present invention is to provide an in-situ X-ray CT imaging device for neutron diffraction spectrometers, which can solve the problem of simultaneous residual stress, Problems with the measurement requirements of internal defects and expansion

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