Scanning electron microscope testing method for iron phosphate sample
A technology of scanning electron microscopy and testing methods, which is applied in the direction of material analysis by measuring secondary emissions, and can solve the problem that surface structure photos cannot correctly reflect the surface structure of iron phosphate
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Embodiment 1
[0033] (1) sample preparation
[0034] Use conductive carbon glue, take a small amount of iron phosphate powder sample with a toothpick, sprinkle it lightly on the conductive glue, and then purge it to remove unadhered powder.
[0035] (2) SEM test
[0036] A field emission scanning electron microscope (purchased from Hitachi) was selected, and the resolution index: 15kv, 0.8nm; 1kv, 1.1nm.
[0037] The above-mentioned field emission scanning electron microscope was used to test the sample prepared in step (1). The parameters used in the test process were: working distance 2.1mm, acceleration voltage 0.7kv. The 100,000-fold iron phosphate SEM photos taken are as follows figure 2 shown.
Embodiment 2
[0039] (1) sample preparation
[0040] Use conductive carbon glue, take a small amount of iron phosphate powder sample with a toothpick, sprinkle it lightly on the conductive glue, and then purge it to remove unadhered powder.
[0041] (2) SEM test
[0042] Select a field emission scanning electron microscope (purchased from Zeiss), resolution index: 15kv, 1.0nm; 1kv, 1.6nm.
[0043] The above-mentioned field emission scanning electron microscope was used to test the sample prepared in step (1). The parameters used in the test process were: working distance 1.8mm, acceleration voltage 1.0kv. The 100,000-fold iron phosphate SEM photos taken are as follows image 3 shown.
Embodiment 3
[0045] (1) sample preparation
[0046] Use conductive carbon glue, take a small amount of iron phosphate powder sample with a toothpick, sprinkle it lightly on the conductive glue, and then purge it to remove unadhered powder.
[0047] (2) SEM test
[0048] Choose a field emission scanning electron microscope (purchased from FEI Company), resolution index: 15kv, 1.0nm; 1kv, 1.3nm.
[0049] The above-mentioned field emission scanning electron microscope was used to test the sample prepared in step (1). The parameters used in the test process were: working distance 4.0mm, acceleration voltage 0.8kv.
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