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A lamp infrared testing system

A technology for infrared testing and lamps, applied in measuring devices, optical radiation measurement, radiation pyrometry, etc., can solve the problems affecting test efficiency, effect and accuracy, distance and focus difference, and bulb life reduction, etc. Infrared test efficiency and accuracy, accurate positioning angle, and the effect of improving service life

Active Publication Date: 2020-07-28
GUANGZHOU HAOYANG ELECTRONICS CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] Due to the limitations of equipment and conditions, most of the existing infrared test devices for lamps use manual adjustment mode. Every time to test the infrared temperature of lamps in different states, it is necessary to move the infrared tester, readjust the distance and focus; When returning to normal operation until the test, there is a certain difference in distance and focus, which seriously affects the test efficiency, effect and accuracy
At the same time, the tester needs to control the test status of the lamps through the console. Every time the status of the lamp is changed, manual debugging is required, and the workload is relatively large.
In addition, lamp life is greatly reduced in frequent changes

Method used

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  • A lamp infrared testing system
  • A lamp infrared testing system
  • A lamp infrared testing system

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0033] Such as Figure 1 to Figure 6 As shown, an infrared test system for lamps, which includes a main test bracket 1, a horizontal axis assembly 3 that is rotatably connected to the top of the main test bracket 1 and used to install the lamp 2 to be tested, is located on the main test bracket 1 And the control module on the horizontal axis assembly 3, the infrared tester 73 that is connected to the horizontal axis assembly 3 through the positioning system assembly 7 and is used for infrared testing of the tested lamp 2, and is located on the test main The bottom of the bracket 1 and the power supply assembly 8 for supplying power to the entire system; between the positioning system assembly 7 and the horizontal axis assembly 3, there is a fastening of the positioning system assembly 7, so that the infrared tester 73 and The tested lamp 2 is relatively stationary to the locking device 9 . The positioning system assembly 7 can rotate, swing or move along the plane where the a...

Embodiment 2

[0045] This embodiment is similar to Embodiment 1, the difference is that, as figure 1 and figure 2 As shown, the first column 11 is provided with at least one placement platform 14, the placement platform 14 is detachably connected to the first column 11, and the first column 11 is provided with holes at different positions. For the placement platform 14 to adjust its position according to the needs of the operator. The placement platform 14 can facilitate the placement of other objects during testing.

[0046] Such as figure 1 and figure 2 As shown, a transformer assembly 15 is provided on the placement platform 14 , and the control panel 51 and / or computer assembly 6 are electrically connected to the power supply assembly 8 through the transformer assembly 15 . The transformer assembly 15 can be selectively used as required. If the voltage required by the control panel 51 and / or the computer assembly 6 is different from the voltage provided by the power supply assembl...

Embodiment 3

[0049] This embodiment is similar to Embodiment 1, and the difference is that the computer component is a tablet computer integrating a display screen, a keyboard and a mouse, and meanwhile, the tablet computer replaces the control panel. That is, the computer components and the control panel are the same tablet.

[0050] Other structures and working principles of this embodiment are the same as those of Embodiment 1.

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Abstract

The invention discloses an infrared testing system for a lamp. The infrared testing system comprises a testing main support, a transverse shaft assembly, an operation and control module, an infrared tester and a power assembly, wherein the transverse shaft assembly is rotatably connected to the top end of the testing main support and used for installing the tested lamp, the operation and control module is arranged on the main support and the transverse shaft assembly, the infrared tester is movably connected to the transverse shaft assembly through a positioning system assembly and used for conducting infrared testing on the tested lamp, and the power assembly is arranged on the testing main support and used for supplying power to the whole system; a locking device is arranged between thepositioning system assembly and the transverse shaft assembly and used for fastening the positioning system assembly so that the infrared tester and the tested lamp can be static relatively. The infrared testing system is simple in structure, convenient to use and capable of greatly improving the efficiency and accuracy when infrared testing is conducted on the lamp, guarantees the uniformity of testing data, and prolongs the service life of the lamp.

Description

technical field [0001] The present invention relates to the technical field of lamps, and more specifically, to an infrared testing system for lamps. Background technique [0002] With the vigorous development of the cultural industry, the light sources of stage lamps and other lighting fixtures have become diversified, and bubble light sources are widely used. Excessive heat generated by the bubble lamp during use will affect the use effect of the lamp, and even cause damage to the lamp. By making the lamps at different angles, showing different colors of light and in different motion states, the infrared temperature of the lamps (bulb glass temperature) is tested by the infrared testing device, so as to monitor the heat dissipation performance of the lamps. [0003] Due to the limitations of equipment and conditions, most of the existing infrared test devices for lamps use manual adjustment mode. Every time to test the infrared temperature of lamps in different states, it...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01J5/00G01J5/02
Inventor 蒋伟楷其他发明人请求不公开姓名
Owner GUANGZHOU HAOYANG ELECTRONICS CO LTD