Method, device and system for batch testing of modules
A technology of batch testing and modules, which is applied in the direction of measuring devices, optical instrument testing, and machine/structural component testing, etc. It can solve problems such as judgment errors, abnormal images, and low slot efficiency, and achieve rapid positioning and automation. High, high test efficiency
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[0045] It should be noted that, in the case of no conflict, the embodiments in the present application and the features in the embodiments can be combined with each other.
[0046] The invention provides a method for batch testing of modules, such as figure 1 As shown, it is a schematic flow chart of a specific embodiment of a method for batch testing of modules in the present invention. The method includes the following steps:
[0047] Obtain slot information, which is the position information of the card slot where the module is placed;
[0048] Determine the module network address according to the slot information and the test machine network address;
[0049] Connect the corresponding module according to the module network address;
[0050] Obtain module device information and display test results, which include module device information and slot information.
[0051] In this embodiment, the module device information specifically includes: device model, firmware versio...
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