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Image defect detection method and device, electronic equipment and storage medium

A defect detection and image technology, applied in the field of image processing, can solve problems such as inability to perform real-time detection and low algorithm operation efficiency, and achieve real-time detection, fast processing speed, and accurate defect detection results

Active Publication Date: 2019-06-11
BOE TECH GRP CO LTD +1
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

However, because this type of method needs to perform Fourier transform on the image first, and then perform inverse Fourier transform after processing, the algorithm is generally inefficient, especially as the screen resolution becomes larger and the amount of data increases. Many, unable to detect in real time

Method used

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  • Image defect detection method and device, electronic equipment and storage medium
  • Image defect detection method and device, electronic equipment and storage medium
  • Image defect detection method and device, electronic equipment and storage medium

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Embodiment Construction

[0079] In order to make the purpose, technical solutions and advantages of the embodiments of the present invention more clear, the following will clearly and completely describe the technical solutions of the embodiments of the present invention in conjunction with the drawings of the embodiments of the present invention. Apparently, the described embodiments are some, not all, embodiments of the present invention. Based on the described embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without creative efforts shall fall within the protection scope of the present invention.

[0080] Unless otherwise defined, the technical terms or scientific terms used in the present disclosure shall have the usual meanings understood by those skilled in the art to which the present invention belongs. "First", "second" and similar words used in the present disclosure do not indicate any order, quantity or importance, but are only use...

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Abstract

The invention discloses an image defect detection method. The method comprises the steps of obtaining a to-be-detected image; carrying out downsampling on the to-be-detected image to obtain a downsampled image; performing clutter removal processing on the down-sampled image to obtain a clutter-removed image; restoring the image subjected to impurity removal into a restored image with the same sizeas the image to be detected, and taking the restored image as a background image; and comparing the to-be-detected image with the background image to obtain a defect point. The invention also discloses an image defect detection device, electronic equipment and a storage medium. According to the image defect detection method and device, the electronic equipment and the storage medium, the image defect detection efficiency can be improved to a certain extent.

Description

technical field [0001] The present invention relates to the technical field of image processing, in particular to an image defect detection method and device, electronic equipment, and a storage medium. Background technique [0002] Various defect points are often produced in the production of LCD screens. These defect points need to be automatically detected on the factory production line and before the screen leaves the factory to locate the positions of various bad points on the screen for further manual analysis. and check. [0003] In the detection of screen defect points, since the position of the screen on the screen detection assembly line is not completely fixed each time, the relative positional relationship between the industrial camera and the screen is always changing when shooting, and the camera body shakes every time it is exposed. Due to changes in ambient light caused by people and objects, it is impossible to obtain a completely accurate and consistent "s...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06T7/00G06T5/00G06T7/10
CPCG06T7/001G06T2207/30121G06T5/50G06T7/90G06T7/40G06T5/20G06T5/77
Inventor 刘小磊陈丽莉王云奇楚明磊
Owner BOE TECH GRP CO LTD