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Stretching equipment for material sample and infrared spectrum analysis system

A technology of infrared spectrum analysis and stretching equipment, which is applied in the field of material sample stretching equipment and infrared spectrum analysis system, can solve the problems of low test efficiency, cumbersome infrared spectrum data detection process, etc., to simplify the process of sample measurement, The effect of improving test efficiency and improving work efficiency

Active Publication Date: 2019-06-14
GUANGDONG UNIV OF TECH
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0003] The purpose of the present invention is to provide a stretching device and an infrared spectrum analysis system for a material sample, which solves the problems of cumbersome detection of infrared spectrum data and low test efficiency of the stretched material sample

Method used

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  • Stretching equipment for material sample and infrared spectrum analysis system
  • Stretching equipment for material sample and infrared spectrum analysis system
  • Stretching equipment for material sample and infrared spectrum analysis system

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Embodiment Construction

[0040] In order to enable those skilled in the art to better understand the solution of the present invention, the present invention will be further described in detail below in conjunction with the accompanying drawings and specific embodiments. Apparently, the described embodiments are only some of the embodiments of the present invention, but not all of them. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.

[0041] Such as Figure 1 to Figure 4 as shown, figure 1 Schematic diagram of the structure of the stretching equipment for the material sample provided in the embodiment of the present invention; figure 2 for figure 1 Schematic diagram of the back structure of the middle stretching device, image 3 Schematic diagram of the structure of the stretching table provided by the embodiment of the present inventi...

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Abstract

The invention discloses stretching equipment for a material sample. The stretching equipment comprises a stretching device arranged in a test light path of an infrared spectroscopy analyzer, and a control device connected with the stretching device through a data connection line, wherein the stretching device comprises a shell, a stretching table encapsulated in the shell and used for stretching ato-be-stretched sample, and a temperature control device encapsulated in the shell, the shell has a through hole penetrating through the shell, when a sample is arranged on the stretching table, thesample faces the through hole in the shell, infrared light emitted by the infrared spectroscopy analyzer radiates the sample through the through hole and penetrates the sample, and the control deviceis used for controlling a stretching parameter of the stretching table for the sample and controlling internal temperature of the shell by the temperature control device. The stretching equipment simplifies the detection process of obtaining infrared spectrum data, and improves sample detection efficiency to a great extent. The invention further provides an infrared spectrum analysis system that has the above beneficial effects.

Description

technical field [0001] The invention relates to the field of infrared spectrum analysis, in particular to a stretching device for a material sample and a system for infrared spectrum analysis. Background technique [0002] Infrared spectroscopic analysis instruments can be used to test the characteristic groups in the sample, and then determine the structure and type of the sample. When testing the sample, it is necessary to stretch the material sample to a certain extent. During the dynamic change of the sample, the infrared spectrum data is detected and analyzed by the infrared spectrum analysis instrument. Therefore, when detecting infrared spectrum data, it is necessary to stretch the test sample to a certain extent, then remove the test sample and place it in the sample chamber of the infrared spectrum analysis instrument, and test the infrared spectrum data of the sample under static conditions; During the dynamic change process of the sample being stretched to differ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N3/08G01N3/02G01N21/3563
Inventor 黄恒辉雷彩红
Owner GUANGDONG UNIV OF TECH