Dual-station chip test sorting machine

Abstract

The invention discloses a dual-station chip test sorting machine. The dual-station chip test sorting machine comprises a pair of feeding assemblies, a pair of test assemblies, a rotating disc assembly, a pressing assembly, and a pair of material dividing boxes which are installed on a working platform. The feeding assemblies are used for conveying to-be-tested chips to the test assemblies; the test assemblies are used for testing the to-be-tested chips; the rotating disc assembly is used for taking out the to-be-tested chips in the feeding assemblies and conveying the to-be-tested chips to thetest assemblies for testing, and finally conveying the to-be-tested chips to the material dividing box for sorting; The pressing assembly is used for controlling a suction nozzle on the rotating discassembly to move up and down and absorb the to-be-tested chips; and the material dividing boxes are used for separately collecting the tested chips. According to the dual-station chip test sorting machine, during the vibration process of the direct shock feeding track, adhered chips are separated through a blowing pipe, and the overlapped to-be-tested chips are separated through the pressing needle, so that it is ensured that the suction nozzle on the rotating disassembly can accurately absorb the to-be-tested chips, thus the production efficiency is improved, and the dual-station chip test sorting machine can be used for chip testing.

Description

technical field [0001] The invention relates to a sorting machine, in particular to a chip testing and sorting machine. Background technique [0002] At present, most of the screening of qualified chips is not completed by using wafer test probe station. The wafer test probe tank is composed of a microscope, a probe holder, a workbench, a wafer holder, an electrical system and an interface display. It is equipped with a tester to complete the electrical parameter test and functional test of the wafer. Due to the limitations of its probes and dotting mechanism, the electrical parameters of this wafer test probe station can only be set to two levels (qualified products and unqualified products, red dots for unqualified products), and only those whose electrical parameters are lower than the set indicators It can be classified as waste as unqualified products, and the actual part of unqualified products can be classified as the next grade (good product or middle-class product)...

AI Technical Summary

Problems solved by technology

Due to the limitations of its probes and dotting mechanism, the electrical parameters of this wafer test probe station can only be set to two levels (qualified products and unqualified products, red dots for unqualified products), and only those whose electrical parameters are lower than the set indicators It can be classified as waste as unqualified products, and the actual part of unqualified products can be classified as the next grade (good products or middle and high grades). The unreasonable testing equipment has caused product waste and increased costs

Secondly, in terms of working speed, due to the need to manually change the wafer and

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