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A method and device for predicting key students in exams based on big data

A technology of big data and students, applied in the field of educational big data

Active Publication Date: 2021-05-14
北京慧辰资道资讯股份有限公司
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0008] In view of this, the present invention provides a method and device for predicting and identifying critical students based on big data of students' academic situation, which is used to solve the problems existing in the existing methods

Method used

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  • A method and device for predicting key students in exams based on big data
  • A method and device for predicting key students in exams based on big data

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Embodiment Construction

[0055] Algorithms related to the present invention are implemented through the software system "HCR Big Data Educational Analysis Platform". The software is developed by the python language, the programming implements the relevant algorithm of the method of the present invention, and completes the entire processing process of individualized analysis of critical students based on the new method.

[0056] In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the following will briefly introduce the drawings that need to be used in the description of the embodiments or the prior art.

[0057] Such as figure 1 As shown, a method based on big data to predict the key students of the exam, the method includes:

[0058] Step 1. Preprocessing and storing the big data of academic situation

[0059] It is used to clean and preprocess the big data of academic situation (including student information, previous examinatio...

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Abstract

The invention discloses a method and device for predicting key students in examinations based on big data, which belongs to the field of big data in education. The method includes: preprocessing and storing the big data of academic situation, predicting students' grades, and finding designated admissions according to the prediction results Key students under the rate. This method predicts students' grades and rankings based on the students' previous test scores, calculates the fluctuation values ​​of students' grades at different levels, and determines the critical number of students according to the fluctuation values; Students; the present invention has changed the traditional method of classifying key students based on empirical models, comprehensively considering the overall and local performance fluctuations of students to determine the number of critical students, the division method is more accurate, and the consideration factors are more comprehensive. The performance of big data is used to predict and identify key students, so that the accuracy and efficiency of recognition have been greatly improved.

Description

technical field [0001] The present invention relates to the field of educational big data, in particular to a method and device for predicting key students in an exam based on big data. Background technique [0002] 1. Identification and promotion of critical students [0003] The key students of the exam. In the field of education, for key exams (such as the high school entrance examination and college entrance examination), some key students, such as critical students, will be paid attention to. Critical students refer to students whose test scores fluctuate above and below the admission score line in important exams (such as senior high school entrance examination, college entrance examination, etc.). For example, if there are 200 undergraduates enrolled in the college entrance examination of a certain school, then the students whose grades fluctuate within a certain range (such as 10%) around the 200th place are the critical students for this college entrance examinatio...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G06Q10/04G06Q10/06G06Q50/20
Inventor 王驰徐文扬
Owner 北京慧辰资道资讯股份有限公司