Non-destructive testing method and system based on multi-channel surface wave analysis of piezoelectric ceramics
A technology of piezoelectric ceramics and piezoelectric ceramic sheets, which is applied in the direction of analyzing solids and materials using sound waves/ultrasonic waves/infrasonic waves, and material analysis using sound waves/ultrasonic waves/infrasonic waves. It can solve the problems of small detection range, low detection accuracy and experience. Strong dependence and other issues, to achieve the effect of low detection cost and high recognition accuracy
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment Construction
[0044] Embodiments of the present invention are described in detail below, examples of which are shown in the drawings, wherein the same or similar reference numerals designate the same or similar elements or elements having the same or similar functions throughout. The embodiments described below by referring to the figures are exemplary and are intended to explain the present invention and should not be construed as limiting the present invention.
[0045] The following describes the non-destructive testing method and system based on multi-channel surface wave analysis of piezoelectric ceramics according to the embodiments of the present invention with reference to the accompanying drawings.
[0046] Firstly, a non-destructive testing method based on multi-channel surface wave analysis of piezoelectric ceramics proposed according to an embodiment of the present invention will be described with reference to the accompanying drawings.
[0047] figure 1 It is a flowchart of a ...
PUM
Abstract
Description
Claims
Application Information
- R&D Engineer
- R&D Manager
- IP Professional
- Industry Leading Data Capabilities
- Powerful AI technology
- Patent DNA Extraction
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com