Method for measuring surface temperature field based on CdTe film

A surface temperature and measurement method technology, which is applied to thermometers, thermometers, and measuring devices with physical/chemical changes, can solve the problems of unsatisfactory measurement accuracy, difficulty in further improving measurement spatial resolution, and limited layout density.

Inactive Publication Date: 2019-07-05
XI AN JIAOTONG UNIV
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Considering the low frequency response of thermocouples and thermal resistors, and the limited arrangement density on the contact surface, it is difficult to further improve the measurement spatial resolution. Infrared imaging technology is prone to large errors due to the influence of the environment, and the measurement accuracy cannot meet the requirements.

Method used

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  • Method for measuring surface temperature field based on CdTe film
  • Method for measuring surface temperature field based on CdTe film
  • Method for measuring surface temperature field based on CdTe film

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0024] (1) The structure of the temperature sensor 1 is as follows: image 3 As shown, the specific production process is as follows: First, mix 1g of gelatin (powder) with 6g of aqueous solution and heat to 50°C to form a gelatin solution, then drop 0.3ml of water-soluble CdTe quantum dots into the gelatin solution, shake the mixed solution fully, shake Afterwards, the mixed solution was heated at a constant temperature of 50°C for 15 minutes, and finally the cleaned glass was selected as the glass substrate 1-1, and the mixed solution was uniformly spin-coated on the surface of the glass substrate 1-1 to prepare a CdTe film 1-2, and after cooling for 6-8 hours, the The surface of the CdTe film 1-2 is pasted with a thermally conductive film 1-3.

[0025] (2) Temperature calibration system such as figure 1 As shown, a heater 6 is placed above the temperature sensor 1 (the heating surface of the heater 6 is in contact with the heat-conducting film 1-3), the temperature of the ...

Embodiment 2

[0029] (1) The structure of the temperature sensor 1 is as follows: image 3 As shown, the specific production process is as follows: First, mix 2g of gelatin (powder) with 16g of aqueous solution and heat to 70°C to form a gelatin solution, then drop 0.8ml of water-soluble CdTe quantum dots into the gelatin solution, shake the mixed solution fully, shake Afterwards, the mixed solution was heated at a constant temperature of 70°C for 15 minutes, and finally the cleaned glass was selected as the glass substrate 1-1, and the mixed solution was uniformly spin-coated on the surface of the glass substrate 1-1 to prepare a CdTe film 1-2, and after cooling for 6-8 hours, the The surface of the CdTe film 1-2 is pasted with a thermally conductive film 1-3.

[0030] (2) Temperature calibration system such as figure 1 As shown, a heater 6 is placed above the temperature sensor 1 (the heating surface of the heater 6 is in contact with the heat-conducting film 1-3), the temperature of the...

Embodiment 3

[0034] (1) Temperature sensor structure 1 such as image 3 As shown, the specific production process is as follows: First, mix 1g of gelatin (powder) with 10g of aqueous solution and heat it to 90°C to form a gelatin solution, then drop 0.5ml of water-soluble CdTe quantum dots into the gelatin solution, shake the mixed solution fully, shake Afterwards, the mixed solution was heated at a constant temperature of 90°C for 15 minutes, and finally the cleaned glass was selected as the glass substrate 1-1, and the mixed solution was evenly spin-coated on the surface of the glass substrate 1-1 to prepare a CdTe film 1-2, which was cooled for 6-8 hours and then placed on the The surface of the CdTe film 1-2 is pasted with a thermally conductive film 1-3.

[0035] (2) Temperature calibration system such as figure 1 As shown, a heater 6 is placed above the temperature sensor 1 (the heating surface of the heater 6 is in contact with the heat-conducting film 1-3), the temperature of the ...

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Abstract

A method for measuring a surface temperature field based on a CdTe film comprises the following steps of preparing a temperature sensor; calibrating temperature, heating the temperature sensor with aheater to obtain a light intensity-temperature curve of the CdTe film; measuring the temperature, placing the calibrated temperature sensor on the wall surface to be measured, obtaining the CdTe luminous intensity, and obtaining a temperature field of the wall surface according to the above-mentioned light intensity-temperature curve. The invention can measure the temperature field by optical method measurement and has high resolution and fast response.

Description

technical field [0001] The invention relates to the technical field of surface temperature field testing, in particular to a method for measuring a surface temperature field based on a CdTe thin film. Background technique [0002] Surface temperature measurement has important and extensive applications in thermal stress analysis of solid parts, large-scale integrated circuit heat dissipation design, dynamic measurement of high-speed rotating parts and other fields. Traditional surface temperature measurement methods include contact-type encrypted array thermocouples or thermal resistance and non-contact technologies such as infrared imaging. Considering the low frequency response of thermocouples and thermal resistors, and the limited arrangement density on the contact surface, it is difficult to further improve the measurement spatial resolution. Infrared imaging technology is prone to large errors due to the influence of the environment, and the measurement accuracy cannot...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01K11/20
CPCG01K11/20
Inventor 牛照程张丹王珍珍王辉辉邓才智
Owner XI AN JIAOTONG UNIV
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