Rectangular waveguide evanescent mode based electromagnetic field probe spatial resolution calibration device

Abstract

The invention discloses a rectangular waveguide evanescent mode based electromagnetic field probe spatial resolution calibration device. The device includes a rectangular waveguide connected to a matching load; the rectangular waveguide has a width a, a height b and a length l, wherein a <= 0.4c / f<max>, b < a, l > 8[lambda]c10, the c is the light velocity in vacuums, f<max> is the highest calibration frequency, and [lambda]c10 is the cut-off wavelength of a dominant mode TE10 mode of the rectangular waveguide; the half position on the upper broad wall of the rectangular waveguide is provided with a slit so as to form a calibration area; a probe can be completely stretched into the slit and move in the slit through the configuration of the width w of the slit and the height b of the rectangular waveguide; and the disturbance of the slit on a waveguide internal field structure can be in the allowed range of calibration precision through the configuration of the width w of the slit. The device is flexible and plastic in design and wide in calibration band, and can obtain large electromagnetic field gradients, so that the device is convenient in calibration operation and high in calibration precision.

Description

technical field [0001] The invention belongs to the field of electromagnetic metrology, in particular to an electromagnetic field probe spatial resolution calibration device based on a rectangular waveguide litter mode. Background technique [0002] When analyzing and rectifying electromagnetic interference (EMI: Electromagnetic Interference) problems, electromagnetic field probes are often used to locate radiation interference sources. The spatial resolution of the probe is an important parameter to evaluate its positioning accuracy. [0003] The spatial resolution of an electromagnetic field probe is considered to be the minimum spatial movement distance that can distinguish changes in the electromagnetic field distribution. At present, there are mainly two calibration methods: the first is to translate the probe horizontally (that is, perpendicular to the transmission direction) at a certain height directly above the conduction band after inputting a signal at the source...

AI Technical Summary

Problems solved by technology

[0005] The present invention aims at the defects of the existing electromagnetic field probe spatial resolution calibration device based on TEM or quasi-TEM type transmission line that the electromagnetic field gradient is small, which is not conducive to testing, and proposes an electromagnetic field probe spatial resolution calibration device based on the rectangular waveguide litter mode, The device utilizes the fading mode of the dominant mode of the rectangular waveguide, where the dominant mode of the rectangular waveguide is TE 10 Mode, that is, the electric field exists only in the section perpendicular to the direction of propagation, and perpendicular to the broadside of the section; the magnetic field has two components

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