Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

A large-scale surface modeling product surveying and mapping device

A technology of curved surface modeling and surveying and mapping devices, applied to measuring devices, optical devices, instruments, etc., can solve problems such as difficult measurement, achieve the effect of reducing the measurement process, reducing difficulty, and ensuring accuracy

Active Publication Date: 2020-11-10
安徽智时代软件服务有限公司
View PDF8 Cites 2 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] The purpose of the present invention is to solve the great limitations in the prior art when measuring heterogeneous parts, especially the difficulty in measuring large-scale curved surface products with complex surface structures, and propose a large-scale curved surface modeling product surveying and mapping device

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • A large-scale surface modeling product surveying and mapping device
  • A large-scale surface modeling product surveying and mapping device
  • A large-scale surface modeling product surveying and mapping device

Examples

Experimental program
Comparison scheme
Effect test

Embodiment

[0027] refer to Figure 1-5 , a surveying and mapping device for large-scale curved surface modeling products, comprising a base 1, the lower surface of the base 1 is provided with a process groove, the lower surface of the base 1 is fixedly connected with a rubber anti-slip mat, and the lower surface of the rubber anti-slip mat is provided with anti-slip lines, the base 1 Two X-direction laser range finders 34 are arranged symmetrically on the upper surface of the top of the product, and the two symmetrically arranged X-direction laser range finders 34 can measure the position of the front and rear side walls of the product, thereby determining the length of the product.

[0028] The upper surface of the base 1 is provided with two symmetrical installation grooves 6, a motor chamber and an equipment chamber 3, and a first motor 16 is arranged in the motor chamber, and a threaded rod 5 is installed horizontally in each installation groove 6, and wherein One end of a threaded r...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses a large-scale curved surface modeling product mapping device, which comprises a base, wherein two X-direction laser range finders are symmetrically arranged on the upper surface of the base, and two mounting grooves, a motor cavity and an equipment cavity are symmetrically arranged on the upper surface of the base, wherein, a first motor is arranged in the motor cavity, a threaded rod is horizontally arranged in each mounting groove, and one end of each threaded rod extends into the equipment cavity and is provided with a synchronizing wheel, wherein two of the synchronizing wheels are provided with a synchronizing belt together, each threaded rod is in threaded connection with a moving seat, and Y-direction laser range finders are arranged on the side walls of thetwo moving seats. The invention has the advantages that: the device is ingenious in structure, can measure the side wall positions and the upper surface positions of different positions of the special-shaped part, can measure large-scale curved surface products with complex surface structures, shortens the measuring time of the special-shaped part, and reduces the measuring process, so that the difficulty of measuring the special-shaped part is reduced.

Description

technical field [0001] The invention relates to the technical field of surveying and mapping devices, in particular to a surveying and mapping device for large-scale curved surface modeling products. Background technique [0002] At present, the three-dimensional measurement method of an object has a three-dimensional image measurement method based on stereo vision technology. This method mainly relies on taking two or more object photos of the measured object, and using a computer to calculate the coordinates of a three-dimensional point based on the principle of triangulation measurement. The device has high requirements on photographic equipment, and the measurement is greatly affected by the environment. In addition, there are also triangulation measurements using telescopes and red and white measuring rulers. This method has great limitations when measuring special-shaped parts, especially for large-scale curved products with complex surface structures. The measurement ...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): G01B11/02G01B11/06
CPCG01B11/028G01B11/0608
Inventor 何红梅
Owner 安徽智时代软件服务有限公司
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com