In-situ compression sample for high-temperature laser confocal microscope

Abstract

The invention discloses an in-situ compression sample for a high-temperature laser confocal microscope, which comprises a compression deformation area and threaded connection parts arranged at two ends of the compression deformation area, wherein the threaded connection parts are matched with a high-temperature laser confocal microscope loading head through threads; tool withdrawal grooves are formed in the tail ends of the threads; the left side and the right side of the compression deformation area extend from the tool withdrawal grooves to the middle and are respectively provided with a convex section; the middle section between the convex sections at two sides is an observation and deformation area of the compression sample; the length of the convex section at one side is greater thanthat of the convex part at the other side; the convex section with the greater length is provided with a thermocouple fixing part; and the observation surface of the middle section and the other surface opposite to the observation surface are both planes, and the section of the convex sections at the two sides is larger than that of the middle section. According to the method, through the optimized design of the in-situ compression sample of the high-temperature laser confocal microscope, the deformation uniformity of the sample is improved, and the microstructure evolution process informationof the deformation area is clearly captured.

Description

technical field [0001] The invention relates to the field of high-temperature microscopic testing of metals, in particular to an in-situ compression sample used in a high-temperature laser confocal microscope. Background technique [0002] The high-temperature in-situ experiment can realize real-time observation of the microstructure of the material during high-temperature static or dynamic loading without changing the field of view or changing the test environment. The existing invention patents have proposed methods for carrying out high-temperature in-situ experiments on equipment such as transmission electron microscopes, scanning electron microscopes, optical microscopes, and neutron scattering spectrometers, and have designed related samples and fixtures. For example: [0003] A Chinese invention patent (application number: 201710791837.6) discloses a high-temperature in-situ sample rod for transmission electron microscopy that can control the heating area to the nano...

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