LED chip thermal vibration accelerated life prediction method based on gray system theory

Abstract

The invention discloses a LED chip thermal vibration accelerated life prediction method based on gray system theory, which comprises the following steps: firstly, applying acceleration stress under different loading modes to an LED chip, and acquiring life experiment original data under different acceleration stress; then, carrying out grey processing on the experiment original data by using a grey system theory to obtain grey analysis data, and constructing a grey system theory prediction model; and finally, carrying out grey correlation degree analysis on the constructed grey system theory model. Compared with the prior art, the grey system prediction model does not need to consider a temperature-vibration interaction relationship and a statistical model related to a physical failure rule, and can obtain efficient and accurate prediction and evaluation. According to the method, the service life of the LED chip under the thermal and vibration double stress in normal work can be estimated through the original service life data under the acceleration stress and the number series prediction of the gray system theory, the prediction result is closer to the engineering practice, and ascientific data theory reference basis can be provided for designing and producing the LED chip with high performance and high stability.

Description

technical field [0001] The invention relates to the technical field of semiconductor lighting, in particular to a method for predicting the thermal vibration accelerated life of an LED chip based on gray system theory. Background technique [0002] LED is the fourth-generation lighting technology invented by modern times and has many advantages such as environmental protection, long service life and high luminous efficiency. It has been used in all aspects of life and production. The working environment of LED products is very complicated, involving heat, vibration, Moisture, volatile chemicals, salt spray, etc. Most of the predecessors studied the effects of heat, current, voltage, and humidity on the reliability of LEDs. Few people studied the effects of vibration on the reliability of LED chips. For electronic components, the environment The proportion of factors that affect reliability, heat accounted for nearly 50%, vibration accounted for 25%, so it is necessary to fin...

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Problems solved by technology

[0004] The accelerated life model is the key to using the accelerated life test information to extrapolate various reliability characteristics of the product under normal stress levels. The acceleration mechanism and effect of accelerated stress on various failure modes are different. The commonly used accelerated life models are as follows: The Arrhenius (Arrhenius) model with temperature as the accelerated stress, the inverse power law model with mechanical stress or electrical stress as the accelerated stress, and the Eyrin model with the dual stress of temperature and electrical stress as the accelerated stress, these models are only applicable In the case of accelerated experiments consistent with the physical model, there are certain limitations

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