Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Weight calibration method of non-binary successive approximation type analog-digital converter

A successive approximation, analog-to-digital converter technology, applied in the direction of analog/digital conversion calibration/test, analog/digital conversion, code conversion, etc., can solve the problem of complex digital design, small redundant space, consumption of storage space and computing units And other issues

Active Publication Date: 2019-08-02
CHENGDU LIGHT COLLECTOR TECH
View PDF8 Cites 13 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0006] But the method disclosed in the patent CN109347477A still has deficiencies, the main reason is that the design of numbers is relatively complicated, and this algorithm must adopt a subtraction operation, and there are the following three problems: (1) the subtraction consumes extra storage space and calculation unit; (2) ) If the mismatch and noise are large, the redundant space obtained in a single calculation process is small; (3) If the noise is small and the average value is relatively normalized, the algorithm will introduce two quantitative statistical errors

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Weight calibration method of non-binary successive approximation type analog-digital converter
  • Weight calibration method of non-binary successive approximation type analog-digital converter
  • Weight calibration method of non-binary successive approximation type analog-digital converter

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0047] In order to make the purpose, technical solution and advantages of the present invention clearer, the specific implementation manners of the present invention will be further described in detail below in conjunction with the accompanying drawings.

[0048] In the present invention, the non-binary successive approximation analog-to-digital converter includes a capacitor array and a virtual capacitor C 0 , where the capacitor array includes n capacitors, and the values ​​of the n capacitors from large to small are C n 、C n-1 、C n-2 、C n-3 ...C 1 and C 1 equal to C 0 ; The mth capacitor mentioned in the present invention refers to the capacitance value in the capacitor array from low to high m capacitor (not including the virtual capacitor C 0 ), that is, the capacitance corresponding to m-bit, the virtual capacitance C 0 Can be represented as bit 0.

[0049] Define the redundant weight of the m-th capacitor as the error between the sum of the current weight of the...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses a weight calibration method for a non-binary successive approximation type analog-digital converter, the non-binary successive approximation type analog-digital converter comprises a capacitor array and a virtual capacitor C0, the capacitor array comprises n capacitors, and n capacitor values from the largest to the smallest are Cn, Cn-1, Cn-2, Cn-3 toC1, and C1 is equal toC. According to the weight calibration calculation method of the mth capacitor, the redundant weight Rm of the mth capacitor is larger than 0, and the mth capacitor refers to the mth capacitor with the capacitance value from low to high in the capacitor array. The invention provides a weight calibration method for the non-binary successive approximation type analog-to-digital converter. Sequential control logic optimization is carried out on sampling and conversion process so that the digital logic of the calibration algorithm is simplified, only the accumulation average process is carried out. Meanwhile, the method has a faster operation result, and only one quantization error is introduced when noise is small.

Description

technical field [0001] The invention belongs to the technical field of electronic circuits, in particular to a weight calibration method of a non-binary successive approximation analog-to-digital converter. Background technique [0002] An analog-to-digital converter (ADC) can convert analog signals into digital signals, and is a key means of obtaining information from nature. As an important medium for obtaining information, ADC is widely used in industrial measurement, wireless communication, image recognition and other fields. With the further development of science and technology, there are more and more requirements for efficient acquisition of information in various fields, and the demand for high-speed and high-precision ADCs continues to increase. [0003] There are many types of ADCs. According to the basic price, they mainly include: Sigma-Delta, single slope, SAR, pipeline, flash, etc. Compared with other ADCs, SAR ADC has the characteristics of high cost perfor...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): H03M1/10H03M1/38
CPCH03M1/1009H03M1/38
Inventor 陈正蔡化陈飞高菊张风体
Owner CHENGDU LIGHT COLLECTOR TECH
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products