Threshold voltage drift detection method and threshold voltage drift detection device

Abstract

The invention provides a threshold voltage drift detection method and a threshold voltage drift detection device. The threshold voltage drift detection method is applied to a pixel driving circuit, and the pixel driving circuit is electrically and separately connected with a control line, a voltage line and a detection node. The detection period comprises a setting stage and a detection stage, andthe threshold voltage drift detection method comprises the following steps of at the setting stage, controlling a transistor included in the pixel driving circuit to be in a bias state; and at the detection stage, providing a predetermined control voltage signal for the control line to provide a predetermined voltage signal for the voltage line, and judging the threshold voltage drift state of the transistor according to the potential of the detection node. According to the present invention, the bias temperature stress test can be directly carried out, and the threshold voltage drift state of the transistor included in the pixel driving circuit can be detected.

Description

technical field [0001] The invention relates to the field of display technology, in particular to a threshold voltage drift detection method and a threshold voltage drift detection device. Background technique [0002] In the prior art, when preparing a display substrate, a driving circuit layer (the driving circuit layer includes a pixel driving circuit) is first provided on the base substrate to form an array substrate, and then the pixel area BTS of the driving circuit layer needs to be performed. (BiasTemperature Stress, bias temperature stress) stability test, after the test is passed, the light emitting element is prepared on the driving circuit layer. [0003] In the prior art, the BTS stability test in the pixel area can only be performed through sample preparation or TEG (Test Element Group, test element group) near the pixel area. The BTS stability test method for sample preparation refers to: by slicing the array substrate, cutting the gate, source and drain of t...

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Problems solved by technology

[0004] The main purpose of the present invention is to provide a threshold voltage drift detection method and a threshold voltage drift detection device, which solve the problem that the array substrate (the array substrate includes a base substrate and a driving circuit layer arranged on the base substrate) cannot be solved in the prior art. ) The problem of directly performing the BTS stability test in the pixel area

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