Calculation method for prolonging the service life of the international grading physical standard for stained cotton
A technology of physical standards and calculation methods, applied in the direction of material analysis, material analysis through optical means, instruments, etc., can solve the doubts about the fairness and accuracy of inspection and quarantine agencies, inconsistent laboratory test results, and physical standards that cannot be reused and other issues to achieve the effect of reducing manual judgment errors, saving expenses, and prolonging the use time
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment Construction
[0019] It should be noted that, in the case of no conflict, the embodiments of the present invention and the features in the embodiments can be combined with each other.
[0020] The present invention will be described in detail below with reference to the accompanying drawings and examples.
[0021] This embodiment relates to a calculation method for prolonging the service life of the international grading physical standard for stained cotton. The method includes: separately customizing the service life of each level of the international general cotton physical standard, and replacing it separately if the standard of this level reaches the service life . The calculation method for prolonging the service life of the international grading physical standard of stained cotton described in the present invention not only prolongs the service time, but also avoids the loss of time due to one-time full replacement by replacing the standards at all levels individually instead of unifo...
PUM
Property | Measurement | Unit |
---|---|---|
reflectance | aaaaa | aaaaa |
Abstract
Description
Claims
Application Information
- R&D Engineer
- R&D Manager
- IP Professional
- Industry Leading Data Capabilities
- Powerful AI technology
- Patent DNA Extraction
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com