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Device and measurement method based on quadruple measurement of mueller matrix spectrum

A measurement method and spectrum technology, applied in the direction of polarization influence characteristics, etc., can solve the problems of long time consumption, high probability of channel crosstalk, high error rate, etc., and achieve the effect of reducing measurement time and good practical value

Active Publication Date: 2021-11-16
XIAN UNIV OF TECH
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0006] The first object of the present invention is to provide a device based on four measurements of the Mueller matrix spectrum, which solves the problems of long measurement time, narrow effective channel bandwidth, and high probability of channel crosstalk in existing measurement devices
[0007] Another object of the present invention is to provide a kind of measuring method based on four measurements of Mueller matrix spectrum, which solves the problems that the existing measuring method takes a long time and has a high error rate

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  • Device and measurement method based on quadruple measurement of mueller matrix spectrum
  • Device and measurement method based on quadruple measurement of mueller matrix spectrum
  • Device and measurement method based on quadruple measurement of mueller matrix spectrum

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Embodiment Construction

[0050] The present invention will be described in detail below with reference to the accompanying drawings and specific embodiments.

[0051] The present invention is based on the device of the Mueller matrix spectrum, such as figure 1 As shown, the light source 1, the light source 1 is sequentially provided in the light source sequence sequentially, the light line 2, the collimation system 3, the laminate 4, the sample table 6, the high-order phase retarder 7, Wollaston prism 8, and reception are sequentially disposed according to the light source 1. unit;

[0052] The collimating system 3 includes a first lens 301 and a second lens 302 in which the incident light is sequentially provided, the purpose of the collimating system 3 is to turn the non-polarized light emitted by the light source 1 to parallel light;

[0053] The receiving unit includes the spectrometer A9 and the spectrometer B10, the spectrometer A9 and the spectrometer B10, respectively, in the direction of the Woll...

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Abstract

The device disclosed by the present invention based on four measurements of the Mueller matrix spectrum includes a light source, followed by a light source, a collimation system, a polarizer, a wave plate, a sample stage, a high-order phase retarder, and a Wollaston prism in sequence according to the incident order of light. and a receiving unit; the collimation system includes a first lens and a second lens arranged in sequence according to the incident light; the receiving unit includes a spectrometer a and a spectrometer b, and the spectrometer a and the spectrometer b are respectively in the direction of the outgoing light of the Wollaston prism. Compared with the time modulation type, the measurement time of the measurement method of the present invention is reduced by at least 4 times; compared with the intensity modulation type, the number of channels is reduced from 37 to 3, the channel interval is increased by 37 / 3 times, and the Muellr matrix spectrum is restored The resolution is increased by 37 / 3 times while greatly reducing the probability of channel crosstalk, which has good practical value.

Description

Technical field [0001] The present invention belongs to the field of polarizing light measurement, and in particular, a device based on four measurement Mueller matrix spectroscopy, the present invention also relates to a measurement method based on four measurement MUELLER matrix spectroscopy. Background technique [0002] The response attribute of the measured object to polarized light can be described by the MUELLER matrix, and the MUELLER matrix is ​​a 4 × 4th-order array containing 16 elements. Many optical features of the sample can be obtained by acquiring the MUELLER matrix spectroscopy, such as an anisotropy of the anisotropy of the surface etching, and the sectional asymmetry of the section. As an optical detection method, Mueller matrix spectroscopy is currently the international research work, especially for the radio to obtain Mueller matrix spectroscopy. It is still in principle exploration and experimental verification stages, and its technical means is not yet mat...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01N21/21
CPCG01N21/21
Inventor 权乃承
Owner XIAN UNIV OF TECH