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Weighted integrated measurement method for multi-view structured light system

A technology of a structured light system and a measurement method, which is applied in the direction of measuring devices, optical devices, instruments, etc., can solve the problems of low measurement accuracy, different degrees of influence on measurement accuracy, and different measurement accuracy, and achieve simple measurement principles, Improvement of accuracy, effect of improvement in measurement accuracy

Inactive Publication Date: 2019-09-24
XI AN JIAOTONG UNIV
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  • Abstract
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  • Application Information

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Problems solved by technology

Calibration is the premise of measurement, so most of the current research improves the measurement accuracy from the aspect of improving the calibration accuracy. However, the measurement model is very single, and it is believed that the imaging camera and structured light projection device in the measurement system have a considerable impact on the measurement accuracy, so directly carry out measurement calculation
However, in the actual calibration process, due to the influence of imaging quality, the feature extraction accuracy and calibration accuracy of each measurement element are not consistent, resulting in different measurement accuracy
Therefore, direct measurement will lead to different degrees of influence of each measuring element on the measurement accuracy, resulting in a result with low measurement accuracy

Method used

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  • Weighted integrated measurement method for multi-view structured light system
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  • Weighted integrated measurement method for multi-view structured light system

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Experimental program
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Embodiment

[0036] The integrated measurement model and the integrated measurement model based on weighted least squares were used to measure ceramic plates and ceramic balls in the same experimental environment. In the integrated measurement of weighted least squares, the left camera is assigned a weight of 0.2, the projector is assigned a weight of 0.7, and the right camera is assigned a weight of 0.1, which are calculated by the measurement method of this application.

[0037] Table 1 Comparison of plane fitting residuals

[0038]

[0039] Comparing the measurement residuals of the two measurement models, the results are shown in Table 1 and Table 2. For the flat panel measurement, compared with the integrated measurement model, the maximum residual error of the weighted integrated measurement is reduced by 2 μm, and the standard deviation is reduced by 2 μm; For the measurement of the difference ball, the radius measurement error of the weighted integrated measurement is reduced to...

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Abstract

The invention discloses a weighted integrated measurement method for a multi-view structured light system. The method is characterized by weighting each measurement component in a measurement system based on the actual calibration parameters of the measurement system, wherein the weights directly affect the final measurement accuracy. The method avoids the low measurement accuracy of a current direct solution that causes different influences on the measurement results because of not taking account of the different calibration accuracy of the respective measurement components. The method not only has a simple measurement principle, but also greatly improves the measurement accuracy, and improves the accuracy of the subsequent three-dimensional structured light measurement.

Description

technical field [0001] The invention belongs to the field of photoelectric measurement, and in particular relates to a weighted integrated measurement method of a multi-eye structured light system. Background technique [0002] 3D structured light measurement technology has become one of the most commonly used methods in 3D measurement due to its advantages of non-contact, fast speed, high precision and simple principle. field. [0003] The three-dimensional structured light measurement method projects the structured light onto the measured object, then combines the projection system, the acquisition system and the measured object reference, and finally uses the triangulation principle to calculate the three-dimensional information of the measured object. Its measurement accuracy is mainly affected by calibration accuracy, measurement environment, measurement model, etc. Calibration is the premise of measurement, so most of the current research improves the measurement acc...

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01B11/25
CPCG01B11/002G01B11/25
Inventor 黄军辉王昭卢磊磊何曾范邢超高建民
Owner XI AN JIAOTONG UNIV