Fault diagnosis test method and device for multi-path output chip

A technology of multi-channel output and testing method, which is applied in the direction of faulty hardware testing method, faulty computer hardware detection, error detection/correction, etc., which can solve inconvenient maintenance and upgrade, low efficiency, failure to use system interface diagnosis automation, etc. problems, to facilitate subsequent maintenance and upgrades

Pending Publication Date: 2019-10-01
BAIC MOTOR CORP LTD
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

The efficiency of this test method is low, and it does not take advantage of the automation of system interface diagnosis, and it is not convenient for subsequent maintenance and upgrades.

Method used

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  • Fault diagnosis test method and device for multi-path output chip
  • Fault diagnosis test method and device for multi-path output chip
  • Fault diagnosis test method and device for multi-path output chip

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Embodiment Construction

[0045] Specific embodiments of the present invention will be described in detail below in conjunction with the accompanying drawings. It should be understood that the specific embodiments described here are only used to illustrate and explain the present invention, and are not intended to limit the present invention.

[0046] In the embodiments of the present invention, unless stated otherwise, the used orientation words such as "up, down, top, bottom" are usually for the directions shown in the drawings or for vertical, vertical or The term used to describe the mutual positional relationship of each component in terms of the direction of gravity.

[0047] figure 1 It is a flow chart of a fault diagnosis and testing method for a multi-channel output chip provided in an embodiment of the present invention, such as figure 1 As shown, the test method includes:

[0048] Set up a configuration table, the configuration table at least includes the output channel ID and the standar...

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Abstract

The embodiment of the invention provides a fault diagnosis testing method and device for a multi-path output chip and a storage medium, and belongs to the field of software development and automatic testing. The method comprises the following steps: establishing a configuration table, wherein the configuration table at least comprises an output channel ID and a standard value corresponding to theoutput channel ID; collecting output values of the specified or all output channels; comparing the output value with a standard value corresponding to an output channel ID in the configuration table;judging whether a fault occurs or not according to a comparison result; and outputting alarm information when a fault occurs. Meanwhile, the invention further provides a diagnosis test device adoptingthe fault diagnosis test method. According to the invention, information related to channel output is managed in a unified manner, so that the code execution and test efficiency is improved, subsequent maintenance and upgrade are facilitated, and the method can be applied to various occasions.

Description

technical field [0001] The invention relates to the fields of software development and automatic testing, in particular to a fault diagnosis and testing method for a multi-channel output chip and a fault diagnosis and testing device for a multi-channel output chip. Background technique [0002] In order to ensure the reliability of the chip's external output, the onboard MCU (Microcontroller Unit, micro control unit) needs to have the ability to detect its output failure. Some chips have their own self-diagnosis function, and the state indication registers for open circuit and other faults are integrated inside, while some chips do not have such a design, and only provide current sensing pins to the outside, and the MCU can sense them through the output of its channels The current intensity is evaluated to diagnose whether the channel output is faulty. The diagnostic software of some chips currently on the market involves the readback of the actual output level of the IO pi...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06F11/22
CPCG06F11/2221G06F11/2273
Inventor 陈俊霏
Owner BAIC MOTOR CORP LTD
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