Run test method based on table lookup method

A test method and table look-up technique, applied in the field of information, can solve problems such as low efficiency of run-length testing, and achieve the effects of fast inspection speed, small memory, and accelerated execution efficiency

Active Publication Date: 2019-10-08
HUNAN GOKE MICROELECTRONICS
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  • Description
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AI Technical Summary

Problems solved by technology

[0006] This application provides a run test method based on the look-up table method to solve the problem of low efficiency of the existing run test

Method used

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Embodiment Construction

[0031] figure 1 It is the flow chart of the run test method based on the look-up table method for this application, such as figure 1 As shown, the application provides a run test method based on the look-up table method, including:

[0032] Step S100, obtaining the sequence E to be tested expressed in bytes 0 E. 1 E. 2 …E (n / 8)-1 , where the byte length of the sequence to be tested is n / 8, and the bit length of the sequence to be tested is n.

[0033] Step S200, performing a table lookup operation according to the sequence to be tested to obtain the total number of runs V.

[0034] In the present application, the data table used in the table lookup operation is a linear table T (a), and the linear table T (a) is used to store the quantity of bit 1 of byte a, wherein, a=0,1,2, ...255. Wherein, the establishment process of linear table T (a) is: to a byte a, a=0,1,2,...255, calculate the number of the bit 1 of this byte; The number of 1s is stored in the linear table T(a...

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Abstract

The invention discloses a run test method based on a table lookup method, which adopts a byte-by-byte mode for a to-be-tested sequence instead of a processing mode of splitting each byte into bits, sothat the execution efficiency of a run test is accelerated, and the problem of lower detection efficiency when a computer executes the run test of a binary sequence is solved. In addition, by means of the characteristic that the first parameter value of the intermediate information calculated during the random number detection process can be shared, if the first parameter S can be obtained from the outside, the first parameter S value is reused, the step of calculating the first parameter S is omitted, and the execution efficiency of the run test is improved. The run test method based on thetable lookup method has the advantages that the check speed is high, the used memory is small, the shared statistical information in the random number detection item is utilized to the maximum extent,and the detection efficiency of a whole detection suite is improved.

Description

technical field [0001] The present application relates to the field of information technology, in particular to a run test method based on a look-up table method. Background technique [0002] In cryptography, random sequences are very important, such as key generation, digital signatures, identity authentication and numerous cryptographic protocols, etc. all use random sequences. Therefore, generating high-quality random number sequences plays a very important role in information security. Random numbers are divided into true random numbers and pseudo-random numbers. Random numbers generated by computers through algorithms are not random numbers in the true sense and are easy to be cracked. They can only be called pseudo-random numbers. Generating truly random numbers would have to be done in hardware, such as pulse detectors using ionizing radiation events, gas discharge tubes, and capacitors with leaks, but it's impossible to equip every computer with such a device. So ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06F7/58G06F21/46
CPCG06F7/588G06F21/46Y02D10/00
Inventor 罗影肖立琨
Owner HUNAN GOKE MICROELECTRONICS
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