High impedance fault identification method and system based on zero-sequence current waveform interval slope curve
A zero-sequence current, high-resistance fault technology, applied in high resistance measurement, identification of patterns in signals, measurement of resistance/reactance/impedance, etc., can solve the influence of nonlinear fault detection, weak fault current, transient characteristics Quantities and high-frequency feature quantities are susceptible to noise interference and other problems, to achieve the effect of suppressing or eliminating the influence of the interval slope
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment Construction
[0041] The present disclosure will be further described below in conjunction with the accompanying drawings and embodiments.
[0042] It should be noted that the following detailed description is exemplary and intended to provide further explanation of the present disclosure. Unless otherwise specified, all technical and scientific terms used in this embodiment have the same meaning as commonly understood by one of ordinary skill in the art to which this disclosure belongs.
[0043] It should be noted that the terminology used herein is only for describing specific embodiments, and is not intended to limit the exemplary embodiments according to the present disclosure. As used herein, unless the context clearly dictates otherwise, the singular is intended to include the plural, and it should also be understood that when the terms "comprising" and / or "comprising" are used in this specification, they mean There are features, steps, operations, means, components and / or combinatio...
PUM
Abstract
Description
Claims
Application Information
- R&D Engineer
- R&D Manager
- IP Professional
- Industry Leading Data Capabilities
- Powerful AI technology
- Patent DNA Extraction
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com