Method and device for testing robustness of SIM card

A robustness testing and equipment technology, applied in electronic circuit testing, measuring electricity, measuring devices, etc., can solve problems affecting user experience, user loss, SIM card failure, etc., to avoid unrealistic voltage stability test results, improve The effect of using feeling and ensuring product quality

Pending Publication Date: 2019-10-11
BEIJING HUAHONG INTEGRATED CIRCUIT DESIGN
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  • Abstract
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Problems solved by technology

[0004] The inventor found through research that with the rise of the Internet of Things business, there are more and more devices connected to the communication network, and the application scenarios are becoming more and more complex. When using the SIM card, it is easy to be interfered by the outside world.
If the test method in the prior art is still used, the relatively stable voltage cannot simulate the interference caused by the ...

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  • Method and device for testing robustness of SIM card
  • Method and device for testing robustness of SIM card
  • Method and device for testing robustness of SIM card

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Embodiment Construction

[0037] In order to enable those skilled in the art to better understand the solutions of the present invention, the technical solutions in the embodiments of the present invention will be clearly and completely described below in conjunction with the drawings in the embodiments of the present invention. Obviously, the described embodiments are only It is a part of embodiments of the present invention, but not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.

[0038] With the rise of the Internet of Things business, more and more devices are connected to the communication network, and the application scenarios are becoming more and more complex. When using the SIM card, it is easy to be interfered by the outside world. However, some robustness testing schemes of existing SIM cards are mainly to test th...

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Abstract

The invention discloses a method and a device for testing robustness of an SIM card. The method comprises the steps of: collecting interference wave waveform data and a simulation running instruction,wherein the simulation running instruction is obtained by simulating an interactive instruction between an application terminal and an SIM card; generating a target interference wave according to theinterference wave waveform data; and enabling the target interference wave and the simulation running instruction to act on the SIM card through a preset action pin, and performing robustness testingon the SIM card. Therefore, according to the preset interference wave waveform data, the interference wave is generated and acts on the SIM card together with the simulation running instruction, theinterference condition of the terminal device on the SIM card due to interference or instability in the actual using environment of any SIM card can be simulated in the robustness testing process, thesituation that the voltage stability testing results of a card reader and a special hardware device are not true in the original testing process is avoided, the robustness testing accuracy of the SIMcard is improved, the product quality of the SIM card is ensured, and the using experience of a user is improved.

Description

technical field [0001] The invention relates to the technical field of product testing, in particular to a method and equipment for robustness testing of a SIM card. Background technique [0002] With the rapid development of science and technology, a mobile phone subscriber identification module (English: Subscriber Identification Module, abbreviation: SIM) card is an important module for mobile networked devices such as mobile phones to identify users. Therefore, a robustness test is usually carried out during the development and production of SIM cards to ensure that the SIM card products have good robustness and improve the user's experience of using the SIM card. [0003] Some existing testing schemes for SIM cards are mainly to test the functional logic of SIM card products. The power supply voltage and voltage signal generated by the special hardware device are relatively stable, that is, the power supply voltage and voltage signal applied to the SIM card are stable ...

Claims

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Application Information

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IPC IPC(8): G01R31/28
CPCG01R31/2856
Inventor 刘青于佳良
Owner BEIJING HUAHONG INTEGRATED CIRCUIT DESIGN
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