Method and device for testing robustness of SIM card

Abstract

The invention discloses a method and a device for testing robustness of an SIM card. The method comprises the steps of: collecting interference wave waveform data and a simulation running instruction,wherein the simulation running instruction is obtained by simulating an interactive instruction between an application terminal and an SIM card; generating a target interference wave according to theinterference wave waveform data; and enabling the target interference wave and the simulation running instruction to act on the SIM card through a preset action pin, and performing robustness testingon the SIM card. Therefore, according to the preset interference wave waveform data, the interference wave is generated and acts on the SIM card together with the simulation running instruction, theinterference condition of the terminal device on the SIM card due to interference or instability in the actual using environment of any SIM card can be simulated in the robustness testing process, thesituation that the voltage stability testing results of a card reader and a special hardware device are not true in the original testing process is avoided, the robustness testing accuracy of the SIMcard is improved, the product quality of the SIM card is ensured, and the using experience of a user is improved.

Description

technical field [0001] The invention relates to the technical field of product testing, in particular to a method and equipment for robustness testing of a SIM card. Background technique [0002] With the rapid development of science and technology, a mobile phone subscriber identification module (English: Subscriber Identification Module, abbreviation: SIM) card is an important module for mobile networked devices such as mobile phones to identify users. Therefore, a robustness test is usually carried out during the development and production of SIM cards to ensure that the SIM card products have good robustness and improve the user's experience of using the SIM card. [0003] Some existing testing schemes for SIM cards are mainly to test the functional logic of SIM card products. The power supply voltage and voltage signal generated by the special hardware device are relatively stable, that is, the power supply voltage and voltage signal applied to the SIM card are stable ...

AI Technical Summary

Problems solved by technology

[0004] The inventor found through research that with the rise of the Internet of Things business, there are more and more devices connected to the communication network, and the application scenarios are becoming more and more complex. When using the SIM card, it is easy to be interfered by the outside world.

If the test method in the prior art is still used, the relatively stable voltage cannot simulate the interference caused by the terminal equipment in the actual use environment to the SIM card due to interference or instability, so the test results do not match the actual results, even if the SIM card that passes the robustness test When the card is in use, it is easy to cause the software function to be damaged, the content of the data area to be damaged and other SIM card failure phenomena, which will cause great losses to the user and affect the user's experience.

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