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Method for realizing IAE MEM post-processing picture identification and annotation based on deep migration

A technology of image recognition and depth, applied in the field of image processing, can solve the problems of difference in judgment results, low efficiency, lack of data annotation, etc., to achieve the effect of improving speed and reliability

Pending Publication Date: 2019-10-25
四川升拓检测技术股份有限公司
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Problems solved by technology

However, these big data have brought serious problems: there is always a lack of perfect data annotation
This method is not only inefficient, but also closely related to the engineer's personal experience, which directly leads to differences in the judgment results of different engineers.

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  • Method for realizing IAE MEM post-processing picture identification and annotation based on deep migration
  • Method for realizing IAE MEM post-processing picture identification and annotation based on deep migration
  • Method for realizing IAE MEM post-processing picture identification and annotation based on deep migration

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Embodiment Construction

[0072] In order to understand the above-mentioned purpose, features and advantages of the present invention more clearly, the present invention will be further described in detail below in conjunction with the accompanying drawings and specific embodiments. It should be noted that, under the condition of not conflicting with each other, the embodiments of the present application and the features in the embodiments can be combined with each other.

[0073] In the following description, many specific details are set forth in order to fully understand the present invention. However, the present invention can also be implemented in other ways different from the scope of this description. Therefore, the protection scope of the present invention is not limited by the following disclosure. limitations of specific examples.

[0074] For the implementation of IAE intelligent identification and labeling method using deep transfer learning in the embodiment of this application, please re...

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Abstract

The invention discloses a method for realizing IAE MEM post-processing picture identification and annotation based on deep migration. The method comprises the steps: A, collecting IAE MEM post-processing images, taking the collected images as a data set, and annotating the data set to define boundary frames of various defects in each image; B, constructing a Tiny Yolo model, generating a trainingset based on the data set, and training the Tiny Yolo model based on the training set; C, based on the trained Tiny Yolo model, identifying and annotating an IAE MEM post-processing picture to be identified. According to the method, the training effect which can only be achieved by big data can be achieved under the condition of small samples through deep transfer learning. The capacity of IAE MEMpost-processing intelligent recognition and labeling of various defects including ultra-thick, non-dense, under-thick and void defects is greatly improved.

Description

technical field [0001] The present invention relates to the field of image processing, in particular to a method for recognizing and labeling images after IAE MEM post-processing based on depth migration. Background technique [0002] Modern society is in an era of big data. Every day and every hour, social networks, intelligent transportation, video surveillance, industry logistics, etc., all generate massive images, texts, voices and other data. The increase in data enables machine learning and deep learning models to rely on such massive amounts of data to continuously train and update the corresponding models, making the performance of the models better and better, and more suitable for specific scenarios. However, these big data have brought serious problems: there is always a lack of perfect data annotation. [0003] As we all know, the training and updating of machine learning models depend on the labeling of data. However, although we can obtain massive amounts of ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06K9/62G06N3/04G06N3/08
CPCG06N3/08G06N3/045G06F18/24G06F18/214
Inventor 张应迁吴佳晔李科冯源邓立苏亚军罗技明
Owner 四川升拓检测技术股份有限公司
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