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Drop test machine with function of preventing secondary impact

A secondary impact and testing machine technology, applied in impact testing, machine/structural component testing, measuring devices, etc., can solve problems such as secondary impact, rebound products, and low test accuracy, to ensure accuracy Effect

Pending Publication Date: 2019-11-05
苏州苏勃检测技术服务有限公司
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, the falling ball is used for testing, which may rebound and cause a secondary impact on the product, resulting in low test accuracy

Method used

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  • Drop test machine with function of preventing secondary impact
  • Drop test machine with function of preventing secondary impact
  • Drop test machine with function of preventing secondary impact

Examples

Experimental program
Comparison scheme
Effect test

Embodiment

[0025] Such as figure 1 , figure 2 and image 3 as shown,

[0026] A drop tester for preventing secondary impact, comprising a base 1, a height adjustment mechanism 2 is arranged on one side of the base 1, and a first sample holder 3 and a second sample holder are also arranged on the base 1 4. The first sample fixing frame 3 and the second sample fixing frame 4 are arranged in dislocation, and the first sample fixing frame 3 and the second sample fixing frame 4 are both provided with a product fixing mechanism 7, and the two are opposite to each other. Setting, the height adjustment mechanism 2 is provided with a falling ball impact mechanism 6, which rises and falls synchronously with the height adjustment mechanism 2, and the falling ball impact mechanism 6 is located between the first sample holder 3 and the second sample holder 4, the The falling ball impact mechanism 6 is provided with an anti-secondary impact mechanism 5 located at the bottom of the falling ball imp...

Embodiment 1

[0032] Such as Figure 4 As shown, on the basis of the above-mentioned embodiments, the anti-secondary impact mechanism 5 in the present invention includes a sleeve 54, and the sleeve 54 is sleeved on the bottom end of the drop tube 61, and the left and right sides in the sleeve 54 Both sides are provided with guide rods, the second spring 52 is sleeved on the guide rod, and a push block is arranged on the outside of the second spring 52, and a strut is provided on the rear end of the drop tube 61, and the strut A cylinder is arranged on the top, which is connected with the push block. The front end of the pole is provided with a first chuck 53 and a second chuck 55 through the rotating shaft, which are arranged in a U-shaped structure, and are also separately arranged on both sides of the bottom of the drop tube 61 , the first chuck 53 and the second chuck 55 located on both sides of the drop tube 61 are connected to the respective corresponding push blocks. When the cylinder...

Embodiment 2

[0035] On the basis of the above-mentioned embodiment and the first embodiment, the ball drop tube 61 in the present invention is provided with a sensor for detecting the ball drop, which is located below the ball drop tube 61 and is lower than the height of the secondary rebound of the ball drop.

[0036] The sensor described in the present invention is an infrared sensor.

[0037] The working principle of the present invention is as follows:

[0038] During specific work, the product is placed on the clamp blocks on the first sample holder 3 and the second sample holder 4, and at the same time, the falling ball tube 61 in the falling ball impact mechanism 6 is fitted to the product through the height adjustment mechanism Place, then, the falling ball (iron ball) is promoted to the required height (adjusted according to demand) by the electromagnet height knob 63, and finally, the power-off treatment electromagnet height knob 63 loses magnetism, and the iron ball falls along ...

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Abstract

The invention relates to a drop test machine with a function of preventing secondary impact. The drop test machine comprises a base, wherein one side of the base is provided with a height adjustment mechanism, the base is further provided with a first sample holder and a second sample holder, the first sample holder and the second sample holder are staggered, the first sample holder and the secondsample holder are provided with product fixing mechanisms respectively, the product fixing mechanisms are oppositely arranged, the height adjustment mechanism is provided with a falling ball impact mechanism synchronously rising and falling with the height adjustment mechanism, the falling ball impact mechanism is located between the first sample holder and the second sample holder, the falling ball impact mechanism is provided with an anti-secondary-impact mechanism, and the anti-secondary-impact mechanism is located at the bottom end of the falling ball impact mechanism. The drop test machine can prevent the secondary impact and ensure the accuracy of product testing.

Description

technical field [0001] The invention relates to a drop test machine, in particular to a drop test machine capable of preventing secondary impact. Background technique [0002] The drop test machine tests the damage of the product package when it is dropped, and evaluates the impact resistance of the electronic component when it is moved. The angle and surface of the packaging container can be tested. However, if the falling ball is used for testing, it may rebound and cause a secondary impact on the product, resulting in low test accuracy. [0003] In view of the above-mentioned defects, the designer actively researches and innovates, in order to create a drop tester with a new structure to prevent secondary impact, so that it has more industrial use value. Contents of the invention [0004] In order to solve the above technical problems, the object of the present invention is to provide a drop tester that prevents secondary impact. [0005] To achieve the above object, ...

Claims

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Application Information

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IPC IPC(8): G01M7/08G01N3/303G01N3/02G01N3/04
CPCG01M7/08G01N3/303G01N3/02G01N3/04G01N2203/0039G01N2203/0252G01N2203/0411
Inventor 谢顺潘燕璐楼莉丹吴志伟
Owner 苏州苏勃检测技术服务有限公司
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