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A Magnetic Measurement Method Based on Optical Spin Hall Effect

A technology of Hall effect and measurement method, which is applied in the direction of using magneto-optical equipment for magnetic field measurement, measuring device, and measuring magnetic variables, etc. It can solve the problems of difficult precise measurement of magneto-optical coefficient Q, high price, and complicated test operation.

Active Publication Date: 2020-11-24
SICHUAN UNIV
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

The value of the magneto-optic coefficient Q can be obtained by spectrometer or in-situ measurement technology, but its size is usually two orders of magnitude smaller than the dielectric tensor of the material, so it is very difficult to precisely measure the magneto-optic coefficient Q
[0005] It can be seen that the existing magnetic measurement technology has disadvantages. For the method with high measurement accuracy, the test operation is often complicated and expensive.

Method used

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  • A Magnetic Measurement Method Based on Optical Spin Hall Effect
  • A Magnetic Measurement Method Based on Optical Spin Hall Effect
  • A Magnetic Measurement Method Based on Optical Spin Hall Effect

Examples

Experimental program
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Effect test

Embodiment 1

[0060] Magnetic Measurement System Based on Optical Spin Hall Effect

[0061] The magnetic measurement system based on the optical spin Hall effect provided in this embodiment, such as figure 1 As shown, it includes a light emitting device 1 , a polarization state preparation device 2 , an electromagnetic field generating device 3 , a polarization state selector 4 and a photodetector device 5 . The light emitting device 1 is composed of a light source generator 6, an energy regulator 7 and a lens A8 arranged in sequence. The light source generator 6 is a helium-neon laser, the energy regulator 7 is a half-wave plate, and the lens A8 is a convex lens with a focal length of 50nm. Both the polarization state generator 2 and the polarization state selector 4 are Glan polarizers. The electromagnetic field generator 3 is EM3. The photodetection device 5 is composed of a photodetector 10 and a lens B 9 located in front of the photodetector 10 . The photodetector 10 is a charge-co...

Embodiment 2

[0072] Example 2 Measurement of magnetocrystalline anisotropy

[0073] In this embodiment, the magnetic measurement system based on the optical spin Hall effect mentioned in Embodiment 1 is used to measure the magnetocrystalline anisotropy of the sample to be tested, and the steps are as follows:

[0074] Step 1, such as figure 1 As shown, the sample to be tested is placed in the working chamber of the electromagnetic field generating device 3, the surface of the sample to be tested is perpendicular to the direction of the electromagnetic field, and the direction of the magnetic field is parallel to the light incident surface; when the electromagnetic field is kept closed, the light source generator 6 is started. At this time, the light beam emitted by the light source generator passes through the energy regulator 7, the lens A 8, and then enters the surface of the sample 11 to be tested, and the light beam reflected by the surface of the sample to be tested is then photoelect...

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Abstract

The invention discloses a magnetic measurement method based on the optical spin Hall effect. The optical spin Hall effect occurs when the polarized light from the polarization state preparation device is reflected by the surface of the sample to be measured, and the left and right circular polarization components are along the vertical direction. The opposite movement occurs in the direction of the incident surface, and the displacement is extremely sensitive to the magnetic parameters of the interface sample and the applied magnetic field. When an external magnetic field is applied to the magnetic sample to be tested, as the strength of the applied magnetic field changes, the center of mass of the light spot will change slightly. This displacement signal is accurately measured by quantum weak measurement technology to achieve high precision and high sensitivity to the magnetization performance of the material. Measurement.

Description

technical field [0001] The invention belongs to the technical field of magnetic measurement, and relates to a magnetic measurement system and a measurement method based on the optical spin Hall effect. Background technique [0002] Magnetism is a very important property of materials. Many materials are widely used in people's daily life because of their magnetic properties. Different magnetic materials have different magnetic properties such as coercive force and saturation magnetic susceptibility. According to these different properties, magnetic materials can be classified and applied in many different fields. For example, permanent magnetic materials have high coercive force and large hysteresis loop area, which can be applied to various electrical appliances such as TV sets, electric meters, and tape recorders. , Another example is that the hysteresis loop of silicon steel sheet is narrow and long, and the energy loss is small, so it is widely used in generators and eng...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01R33/10G01R33/032G01R33/07
CPCG01R33/032G01R33/07G01R33/10
Inventor 李彤张志友余天王琦
Owner SICHUAN UNIV